Untitled
Abstract: No abstract text available
Text: Reliability Summary of SEC555 AIGaAsrSi IRED Chip Long-Term Operating Life Study IRED CHIP DEGRADATION STUDIES MECHANICAL RELIABILITY Honeywell has an ongoing study ot degradation of radiant output over time as a function of temperature and current for the SEC555 aluminum gallium arsenide
|
OCR Scan
|
SEC555
SE3470,
|
PDF
|
teradyne A360
Abstract: No abstract text available
Text: Reliability Reliability Summary of SEC450 GaAs:Si IRED Chip Long-Term Operating Life Study Figure 1 IRED CHIP DEGRADATION STUDIES Honeywell is engaged In an ongoing study of degradation of radiant output over time as a function of temperature for the SEC450 GaAs IRED gallium
|
OCR Scan
|
SEC450
SE1450
SE1470
SE3453/5453
SE3455/5455
SE34705470
SEP8505
SEP8705
SEP8506
teradyne A360
|
PDF
|
thyristor TAG 8506
Abstract: nais inverter vf 7f operation manual 922AA1Y-A4P optek A400 817 Sprague 513D sprague 926c Sprague 195P Rapa relay 12vdc triac tag 8948 Mascot 719
Text: TABLE OF CONTENTS Catalog Number 11Q New For 1989! • Over 7,900 New Products • 13 New M anufacturers PRODUCT INDICES tiamp*,'fminei forskSockets ' Solder Equipment endTtfob ] vriHp\< lint Equipment, Panel Meters, Aejulpmant, i A P R E M IE R C o m p an y
|
OCR Scan
|
11PM104
thyristor TAG 8506
nais inverter vf 7f operation manual
922AA1Y-A4P
optek A400 817
Sprague 513D
sprague 926c
Sprague 195P
Rapa relay 12vdc
triac tag 8948
Mascot 719
|
PDF
|
SEP8703
Abstract: honeywell 940 Quantum Effect Devices A360 SE3470 SE5470 SEC555 SEP8790 teradyne A360
Text: Reliability Summary of SEC555 AlGaAs:Si IRED Chip Long-Term Operating Life Study INTRODUCTION Honeywell is committed to the manufacture of reliable, high quality optoelectronic products. An ISO9001 based quality system is maintained, providing the necessary
|
Original
|
SEC555
ISO9001
SE3470,
SEP8703
honeywell 940
Quantum Effect Devices
A360
SE3470
SE5470
SEP8790
teradyne A360
|
PDF
|