SEC450 Search Results

SEC450 Datasheets (2)

Part	ECAD Model	Manufacturer	Description	Curated	Datasheet Type	PDF
SEC4501C		Sanken Electric	Devices for Automotive Application		Original	PDF
SEC4503C		Sanken Electric	Devices for Automotive Application		Original	PDF

SEC450 Datasheets Context Search

Catalog Datasheet	MFG & Type	Document Tags	PDF
SEC4203C Abstract: SEC4403C SEC4503C SEC4703C SEC4803C SEC4903C SEC-400 Text: 5-1-3 Unicolor surface mount •Side View Surface Mount LEDs Inner Lens Type SEC4003 Series Part Number * * * * * * Lens Color Emitting Color SEC4203C SEC4803C SEC4903C SEC4703C SEC4403C SEC4403E-TG SEC4503C Water clear Water clear Water clear Water clear	Original	SEC4003 SEC4203C SEC4803C SEC4903C SEC4703C SEC4403C SEC4403E-TG SEC4503C SEC1005/1007 SEC4203C SEC4403C SEC4503C SEC4703C SEC4803C SEC4903C SEC-400	PDF
SEC4701C Abstract: SEC4201C SEC4401C SEC4401E-TG SEC4501C SEC4801C SEC4901C Text: 5-1-3 Unicolor surface mount •Side View Surface Mount LEDs SEC4001 Series Part Number SEC4201C * SEC4801C SEC4901C * SEC4701C * SEC4401C * SEC4401E-TG SEC4501C SECU4401C-TG * SECT4D01C-S * SECT4E01C-S Emitting Color Lens Color Red Amber Orange Yellow Green	Original	SEC4001 SEC4901C SEC4701C SEC4401C SEC4401E-TG SEC4501C SECU4401C-TG SECT4D01C-S SECT4E01C-S SEC4201C SEC4701C SEC4201C SEC4401C SEC4401E-TG SEC4501C SEC4801C SEC4901C	PDF
teradyne A360 Abstract: IRED A360 SE1450 SE2460 SE3450 SE5450 SEP8505 SEP8506 SE1455 Text: Reliability Summary of SEC450 GaAs:Si IRED Chip Long-Term Operating Life Study INTRODUCTION Honeywell is committed to the manufacture of reliable, high quality optoelectronic products. An ISO 9001 quality system is maintained, providing the necessary controls to assure that all product meets or exceeds the	Original	SEC450 SE1450/1455 SE3450/5450 SEP8505 SEP8506 SEP8507 teradyne A360 IRED A360 SE1450 SE2460 SE3450 SE5450 SE1455	PDF
SMA2409M Abstract: MN638S SSD103 SPF3004 sta464c spf0001 spf7211 relay Re 04501 sta509a SLA2402M Text: 注意 ●本書に記載されている内容は改良などにより予告なく変更することがあります。ご使用の際には最新の情報であることをご確認ください。 ●本書に記載されている動作例及び回路例は、使用上の参考として示したもので、	Original	5871FAX H1-C01JE0-0605010TA SMA2409M MN638S SSD103 SPF3004 sta464c spf0001 spf7211 relay Re 04501 sta509a SLA2402M	PDF
SK 18752 Abstract: SK 18751 2SC5586 SI-18752 fn651 709332a CTB-34D SLA6102 SLA4052 SI 18751 Text: Bulletin No O03ED0 （May, 2008） SEMICONDUCTORS GENERAL CATALOG ICS TRANSISTORS THYRISTORS DIODES LEDS LE D Diode I C Thyristor Tr a n s i s t o r SANKEN ELECTRIC CO., LTD. http://www.sanken-ele.co.jp/en/index.html Warning ● The contents in this document are subject to changes, for improvement and other purposes,	Original	O03ED0 dete7837 H1-O03ED0-0805020NM SK 18752 SK 18751 2SC5586 SI-18752 fn651 709332a CTB-34D SLA6102 SLA4052 SI 18751	PDF
triac zd 607 Abstract: transistor C5586 bridge rectifier sanken rb40 rb40 bridge rectifier rb60 bridge rectifier ZD 607 - triac CTPG2F CTX12S Toshiba transistor c4468 STA524A Text: Warning ● The contents in this document are subject to changes, for improvement and other purposes, without notice. Make sure that this is the latest version of the document before use. ● The operation and circuit examples in this document are provided for reference purposes	Original	The32-246622 H1-O03EA0-0510020NM triac zd 607 transistor C5586 bridge rectifier sanken rb40 rb40 bridge rectifier rb60 bridge rectifier ZD 607 - triac CTPG2F CTX12S Toshiba transistor c4468 STA524A	PDF
HONEYWELL OPTOELECTRONICS Abstract: HFE4023 "se-3352" teradyne A360 HFE4003 C616C HFE4000 sidelooker DIODE HFE4020 se3352 Text: Application Note Long-Term Power Output Reliability of Cap Rock SEC589 LED Chip INTRODUCTION Honeywell Optoelectronics is committed to the manufacture of reliable, high quality optoelectronic products. A MIL-Q-9858 based quality system is maintained, providing the necessary controls to assure	Original	SEC589) MIL-Q-9858 HFE4023 HLC3001 HONEYWELL OPTOELECTRONICS "se-3352" teradyne A360 HFE4003 C616C HFE4000 sidelooker DIODE HFE4020 se3352	PDF
Untitled Abstract: No abstract text available Text: 5-1 Visible Light LEDs Absolute Maximum Ratings ●Visible Light Unicolor Lamp Parameter Unit PD IF ∆IF IFP VR Top Tstg mW mA mA/°C mA V °C °C Ratings GaP GaAsP GaAlAs AlGaInP InGaN Conditions GaN 120 75 30 −0.45 100 25°C or higher f=1kHz, tw ≤100 µ s	Original		PDF
SK 18752 Abstract: 2SC5586 SK 18751 sla6101 sk c4467 STR20012 SLA6102 sk A1186 SK C5071 fn651 Text: SANKEN 半导体 CONTENTS 目录 1 集成电路 1-1 1-2 2 1-1-2 开关式稳压集成电路 . 41 1-1-3 多路输出型稳压集成电路 . 93	Original	TF320M TF341M TF320M-A TF321M-A TF321M TF325P TF341S TF521M TF521S SK 18752 2SC5586 SK 18751 sla6101 sk c4467 STR20012 SLA6102 sk A1186 SK C5071 fn651	PDF
SMA2409M Abstract: spf 9001 sanken mn638s SPF0001 SPF3004 SPF3006 relay Re 04501 Ignition ICs SPF7211 ssd103 Text: SANKEN ELECTRIC CO.,LTD. CAUTION / WARNING • The information in this publication has been carefully checked and is believed to be accurate; however, no responsibility is assumed for inaccuracies. • Sanken reserves the right to make changes without further notice to any products herein	Original	H1-C01ED0-0607020TA SMA2409M spf 9001 sanken mn638s SPF0001 SPF3004 SPF3006 relay Re 04501 Ignition ICs SPF7211 ssd103	PDF
SEP8703 Abstract: honeywell 940 Quantum Effect Devices A360 SE3470 SE5470 SEC555 SEP8790 teradyne A360 Text: Reliability Summary of SEC555 AlGaAs:Si IRED Chip Long-Term Operating Life Study INTRODUCTION Honeywell is committed to the manufacture of reliable, high quality optoelectronic products. An ISO9001 based quality system is maintained, providing the necessary	Original	SEC555 ISO9001 SE3470, SEP8703 honeywell 940 Quantum Effect Devices A360 SE3470 SE5470 SEP8790 teradyne A360	PDF
teradyne A360 Abstract: No abstract text available Text: Reliability Summary of SEC450 GaAs:Si IRED Chip Long-Term Operating Life Study Figure 1 IRED CHIP DEGRADATION STUDIES Honeywell is engaged in an ongoing study of degradation of radiant output over time as a function of temperature for the SEC450 GaAs IRED gallium	OCR Scan	SEC450 SEP8505 SEP8506 SEP8507 teradyne A360	PDF
teradyne A360 Abstract: No abstract text available Text: Reliability Reliability Summary of SEC450 GaAs:Si IRED Chip Long-Term Operating Life Study Figure 1 IRED CHIP DEGRADATION STUDIES Honeywell is engaged In an ongoing study of degradation of radiant output over time as a function of temperature for the SEC450 GaAs IRED gallium	OCR Scan	SEC450 SE1450 SE1470 SE3453/5453 SE3455/5455 SE34705470 SEP8505 SEP8705 SEP8506 teradyne A360	PDF
Untitled Abstract: No abstract text available Text: Reliability Summary of SEC555 AIGaAsrSi IRED Chip Long-Term Operating Life Study IRED CHIP DEGRADATION STUDIES MECHANICAL RELIABILITY Honeywell has an ongoing study ot degradation of radiant output over time as a function of temperature and current for the SEC555 aluminum gallium arsenide	OCR Scan	SEC555 SE3470,	PDF