28C17 Search Results
28C17 Price and Stock
Rochester Electronics LLC CAT28C17AWI-20TCAT28C17 - 16-KBit Parallel EEPR |
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CAT28C17AWI-20T | Bulk | 1,000 | 80 |
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Rochester Electronics LLC CAT28C17AK20IC EEPROM 16KBIT 8SOIC |
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CAT28C17AK20 | Bulk | 520 | 81 |
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Rochester Electronics LLC CAT28C17AW20IC EEPROM 16KBIT 28SOIC |
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CAT28C17AW20 | Bulk | 135 | 81 |
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Microchip Technology Inc AT28C17-15JCIC EEPROM 16KBIT PARALLEL 32PLCC |
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AT28C17-15JC | Tube |
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Microchip Technology Inc AT28C17E-20SCIC EEPROM 16KBIT PARALLEL 28SOIC |
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AT28C17E-20SC | Tube | 270 |
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28C17 Datasheets (388)
Part | ECAD Model | Manufacturer | Description | Curated | Datasheet Type | ||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||
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28C17-10 | General Instrument | 16K ELECTRCALLY ERASABLE PROM | Scan | ||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||
28C17-15 | General Instrument | 16K ELECTRCALLY ERASABLE PROM | Scan | ||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||
28C17-15/D | General Semiconductor | 16K (2K x 8) CMOS Electrically Erasable PROM | Scan | ||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||
28C17-15I/D | General Semiconductor | 16K (2K x 8) CMOS Electrically Erasable PROM | Scan | ||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||
28C17-15I/J | General Semiconductor | 16K (2K x 8) CMOS Electrically Erasable PROM | Scan | ||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||
28C17-15I/K | General Semiconductor | 16K (2K x 8) CMOS Electrically Erasable PROM | Scan | ||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||
28C17-15I/L | General Semiconductor | 16K (2K x 8) CMOS Electrically Erasable PROM | Scan | ||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||
28C17-15I/P | General Semiconductor | 16K (2K x 8) CMOS Electrically Erasable PROM | Scan | ||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||
28C17-15I/S | General Semiconductor | 16K (2K x 8) CMOS Electrically Erasable PROM | Scan | ||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||
28C17-15I/W | General Semiconductor | 16K (2K x 8) CMOS Electrically Erasable PROM | Scan | ||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||
28C17-15/J | General Semiconductor | 16K (2K x 8) CMOS Electrically Erasable PROM | Scan | ||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||
28C17-15/K | General Semiconductor | 16K (2K x 8) CMOS Electrically Erasable PROM | Scan | ||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||
28C17-15/L | General Semiconductor | 16K (2K x 8) CMOS Electrically Erasable PROM | Scan | ||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||
28C17-15M/D | General Semiconductor | 16K (2K x 8) CMOS Electrically Erasable PROM | Scan | ||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||
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28C17-15M/J | General Semiconductor | 16K (2K x 8) CMOS Electrically Erasable PROM | Scan | ||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||
28C17-15M/K | General Semiconductor | 16K (2K x 8) CMOS Electrically Erasable PROM | Scan | ||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||
28C17-15MR/D | General Semiconductor | 16K (2K x 8) CMOS Electrically Erasable PROM | Scan | ||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||
28C17-15MR/J | General Semiconductor | 16K (2K x 8) CMOS Electrically Erasable PROM | Scan | ||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||
28C17-15MR/K | General Semiconductor | 16K (2K x 8) CMOS Electrically Erasable PROM | Scan | ||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||
28C17-15M/S | General Semiconductor | 16K (2K x 8) CMOS Electrically Erasable PROM | Scan |
28C17 Datasheets Context Search
Catalog Datasheet | Type | Document Tags | |
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Contextual Info: b3E I> • bl032Gl QGG7S33 E46 IP1CHP MICROCHIP TECHNOLOGY INC 28C17A Microchip 16K 2K X 8 CMOS Electrically Erasable PROM FEATURES need of external components. During a “byte write”, the address and data are latched internally, freeing the microprocessor address and data bus for other opera |
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bl032Gl QGG7S33 28C17A polS11127D-page bl032Ql 28C17AF 200ns DS11127D-page | |
Contextual Info: M 28C16B M 28C17B 16 Kbit 2K x 8 Parallel EEPROM With Software Data Protection PRELIMINARY DATA • Fast Access Time: 90 ns at Vcc=5V ■ Single Supply Voltage: - 4.5 V to 5.5 V for M28CxxB - 2.7 V to 3.6 V for M28CxxB-W ■ Low Power Consumption ■ Fast BYTE and PAGE WRITE (up to 64 Bytes) |
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28C16B 28C17B M28CxxB M28CxxB-W M28C16B M28C17B 2048x8 | |
Contextual Info: $ M 28C17A ic r o c h ip 16K 2K x 8 CMOS EEPROM PACKAGE TYPE FEATURES • Fast Read Access Time— 150 ns • CMOS Technology for Low Pow er Dissipation - 30 m A Active - 100 (iA Standby • Fast Byte Write Time— 200 us or ms • Data Retention >10 years |
OCR Scan |
28C17A DS11127E-page | |
Contextual Info: 28C17A M icro c h ip 16K 2K x 8 CMOS Electrically Erasable PROM FEATURES DESCRIPTION • Fast Read Access Time— 150ns Maximum • CMOS Technology for Low Power Dissipation — 30mA Active — 100|xA Standby • Fast Byte Write Time— 200n.s or 1ms • Data Retention >10 years |
OCR Scan |
28C17A 150ns DS11127C-6 DS11127C-8 200ns | |
Contextual Info: M $ 28C17A ic r o c h ip 16K 2K x 8 CMOS EEPROM FEATURES • Fast Read Access Time— 150 ns • CMOS Technology for Low Power Dissipation - 30 mA Active - 100 |iA Standby • Fast Byte Write Time—200 ¡is or 1 ms • Data Retention >200 years • High Endurance- Minimum 104 Erase/Write Cycles |
OCR Scan |
ROY/B57C 1/01C 28C17A Time--200 DS11127H-page7-23 28C17A 8x20mm | |
200B
Abstract: 28C17A
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28C17A 32-Pin MS-016AE DS00049M-page 200B 28C17A | |
M28C16
Abstract: M28C17 PDIP28 S028
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M28C17 PDIP28 M28C17 PLCC32 M28C16 PDIP28 S028 | |
200B
Abstract: 28C17A DK-2750 RG41
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28C17A 200B 28C17A DK-2750 RG41 | |
Contextual Info: M i c r o c h i p 28C17A » 16K 2K x 8 CMOS EEPROM FEATURES • Fast Read Access Time— 150 ns • CMOS Technology for Low Power Dissipation - 30 mA Active - 100 nA Standby • Fast Byte W rite Time— 200 us or 1 ms • Data Retention >200 years • High Endurance - Minimum 104 Erase/Write Cycles |
OCR Scan |
28C17A 32-Pin S-016 DS00049M-page | |
c17fContextual Info: 3890002 QENL 83 D 0 3 3 9 6 ÏNSTR/ M I C R O C H I P MI CROCHIP TECHNOLOGY INC GENERAL INSTRUMENT A3 D 28C16/28C17 blGBSDl 0 0 0 3 3 ^ ÜTf 7 PBELDH01N1ÂRV DIM FO M ATDO IN] 16K 2K X 8 CMOS Electrically Erasable PROM FEATURES • Fast Read Access Time — 150 ns |
OCR Scan |
28C16/28C17 PBELDH01N1 28C17 DS11110A-8 c17f | |
Contextual Info: M 28C17A ic r o c h ip 16K 2K x 8 CMOS EEPROM PACKAGE TYPE FEATURES • Fast Read A ccess Time— 150 ns • CMOS Technology fo r Low P ow er Dissipation - 30 m A Active - 100 (iA S tandby • Fast Byte W rite Time— 200 |xs o r 1 ms • Data Retention >10 years |
OCR Scan |
28C17A DS11127E-page | |
Contextual Info: M 28C17A ic r o c h ip 16K 2K x 8 CMOS EEPROM FEATURES • Fast Read Access Time—150 ns • CMOS Technology for Low Power Dissipation — 30 mA Active — 100 (iA Standby • Fast Byte Write Time—200 us or 1 ms • Data Retention >10 years • High Endurance - Minimum 104 Erase/Write Cycles |
OCR Scan |
28C17A 28C17AF DS11127E-page 8x20mm | |
Contextual Info: 28C17A M ic r o c h ip 16K 2K x 8 CMOS EEPROM PACKAGE TYPE FEATURES • Fast Read Access Time— 150 ns • CMOS Technology for Low Power Dissipation - 30 mA Active - 100 jiA Standby • Fast Byte Write Time— 200 ps or 1 ms • Data Retention >200 years |
OCR Scan |
28C17A 32-updates. DS11127F L103201 | |
Contextual Info: 28C17A M icro ch ip 16K 2K x 8 CMOS Electrically Erasable PROM FEATURES DESCRIPTION • Fast Read Access Time— 150ns Maximum • CMOS Technology for Low Power Dissipation — 30mA Active — 100|oA Standby • Fast Byte Write Time— 200ns or 1 ms • Data Retention >10 years |
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28C17A 150ns 200ns 28C17A DS11127C-7 28C17AF 200ns | |
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tce 1994Contextual Info: 28C17A 16K 2K x 8 CMOS EEPROM 30 NC 2 RDY/BSY 1 NU 32 Vcc 31 WE 29 A8 28 A9 27 NC 26 NC PLCC 25 OE 24 A10 23 CE 22 I/O7 20 19 18 21 I/O6 17 Vcc WE NC A8 A6 5 A9 A5 6 NC A4 7 A3 8 OE A10 A2 9 A1 10 CE A0 11 I/O7 NC 12 I/O6 I/O0 13 I/O5 I/O4 I/O3 16 DIP/ SOIC |
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28C17A Time--150 Time--200 DS11127F-page tce 1994 | |
28C17AContextual Info: Obsolete Device 28C17A 16K 2K x 8 CMOS EEPROM 2004 Microchip Technology Inc. 30 NC 2 RDY/BSY 1 NU 32 Vcc 31 WE 4 A7 3 NC 29 A8 28 A9 27 NC 26 NC 25 OE 24 A10 23 CE 22 I/O7 20 19 18 17 16 21 I/O6 15 Vcc WE NC A8 A6 5 A9 A5 6 NC A4 7 A3 8 OE A10 A2 9 A1 10 |
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28C17A D-85737 NL-5152 28C17A | |
Contextual Info: 28C17A 16K 2K x 8 CMOS EEPROM 1998 Microchip Technology Inc. 30 NC 2 RDY/BSY 1 NU 32 Vcc 31 WE 4 A7 3 NC 29 A8 28 A9 27 NC 26 NC 25 OE 24 A10 23 CE 22 I/O7 20 19 18 17 16 21 I/O6 15 Vcc WE NC A8 A6 5 A9 A5 6 NC A4 7 A3 8 OE A10 A2 9 A1 10 CE A0 11 I/O7 |
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28C17A Time--150 Time--200 32-Pin DS11127I-page | |
Contextual Info: 28C17A 16K 2K x 8 CMOS EEPROM 30 NC 2 RDY/BSY 1 NU 32 Vcc 31 WE 29 A8 28 A9 27 NC 26 NC 25 OE 24 A10 23 CE 22 I/O7 20 19 18 17 16 21 I/O6 15 Vcc WE NC A8 A6 5 A9 A5 6 NC A4 7 A3 8 OE A10 A2 9 A1 10 CE A0 11 I/O7 NC 12 I/O6 I/O0 13 I/O5 I/O4 I/O3 14 28 27 |
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28C17A DS11127G-page | |
Contextual Info: 28C17A DICE FORM Microchip 16K 2K X 8 CMOS Electrically Erasable PROM FEATURES DESCRIPTION • 250ns Access Time • CMOS Technology for Low Power Dissipation — 30mA Active — 100|iA Standby • Fast Byte Write Time— 1ms • Automatic Write Operation |
OCR Scan |
28C17A 250ns 28C17A The28C17A DS11134A-6 DS11134A-8 | |
10F-1CContextual Info: JÊ Ë Ê È L * & 28C17A M ig z r o n c h ip i 16K 2K X 8 CMOS EEPROM FEATURES • Fast Read Access Time— 150 ns • CMOS Technology for Low Power Dissipation - 30 mA Active - 100 |^A Standby • Fast Byte W rite Time— 200 |^s or 1 ms • Data Retention >200 years |
OCR Scan |
32-Pin DS111271-page 10F-1C | |
28C17AContextual Info: M 28C17A ic r o c h ip 16K 2K x 8 CMOS EEPROM FEATURES • Fast Read Access Time— 150 ns • CMOS Technology for Low Power Dissipation - 30 mA Active - 100 |iA Standby • Fast Byte Write Time—200 us or 1 ms • Data Retention >10 years • High Endurance - Minimum 104 Erase/Write Cycles |
OCR Scan |
28C17A 32-Pin 28-Pin | |
Contextual Info: 28C17A M ic r o c h ip 16K 2K X 8 CMOS Electrically Erasable PROM need of external components. During a “byte write”, the address and data are latched internally, freeing the microprocessor address and data bus for other opera tions. Following the initiation of write cycle, the device |
OCR Scan |
28C17A 28C17AF DS11127D-page | |
Contextual Info: 28C17A 16K 2K x 8 CMOS EEPROM 1998 Microchip Technology Inc. 30 NC 2 RDY/BSY 1 NU 32 Vcc 31 WE 4 A7 3 NC 29 A8 28 A9 27 NC 26 NC 25 OE 24 A10 23 CE 22 I/O7 20 19 18 17 16 21 I/O6 15 Vcc WE NC A8 A6 5 A9 A5 6 NC A4 7 A3 8 OE A10 A2 9 A1 10 CE A0 11 I/O7 |
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28C17A Time--150 Time--200 32-Pin | |
Contextual Info: $ 28C17A M ic r o c h ip 16K 2K x 8 CMOS EEPROM • Fast Read Access Time— 150 ns • CMOS Technology for Low Power Dissipation — 30 mA Active — 100 nA Standby • Fast Byte Write Time— 200 |is or 1 ms • Data Retention >10 years • High Endurance - Minimum 104 Erase/Write Cycles |
OCR Scan |
28C17A 32-Pin 28C17AF 8x20mm 28C17A DS11127E-page |