RT14100A Search Results

actel 14100

Abstract: A1020B
Contextual Info: v3.0 RadTolerant FPGAs Fe a t ur es Gener al C har act er is t ics • 100% Resource Utilization with 100% Pin-Locking • Tested Total Ionizing Dose TID Survivability Level • Secure Programming Technology Prevents Reverse Engineering and Design Theft

RT14100A

Abstract: rt1280 VKS FPGA CQFP 172 RT1280A CQFP 172 PIN 172-PIN A1280A VKS RT1460 VKS FPGA CQFP 106 A1020B
Contextual Info: v3.1 RadTolerant FPGAs Features General Characteristics • • • • • • Tested Total Ionizing Dose TID Survivability Level No Single Event Latch-Up Below a Minimum LET (Linear Energy Transfer) Threshold of 80 MeV-cm2/mg for All RT (RadTolerant) Devices

Cqfp256

Abstract: RQFP240 SI-EX-TCA Act2 FPGA CQFP 172 A1280A SDO RQFP208 06M7374 ACTEL A42MX09 PQFP208 RT1280A
Contextual Info: Silicon Explorer II User's Guide Actel Corporation, Mountain View, CA 94043-4655 2003 Actel Corporation. All rights reserved. Printed in the United States of America Part Number: 5029134-1 No part of this document may be copied or reproduced in any form or by any means without

actel cqfp 84

Abstract: A1010B ACTEL FBGA 144
Contextual Info: v3.0 Package Options: User I/Os per Package C om m e r c i a l / I nd us t r i a l D ev i c e s A54SX16 A54SX16P A54SX32 130 175 175 174 81 81 81 A54SX08 A54SX72A SX A54SX32A A54SX16A 44 A54SX08A PLCC SX-A eX256 Pins eX128 Package eX64 eX 68 84 PQFP 69 100

ACT1020

Abstract: JH05 MARKING CODE N-CHANNEL MOS FIELD EFFECT TRANSISTOR 44 pin actel 1020b JEDEC-A113 ACTEL 1020B ACP55 smd U1p Jl03 JL-03
Contextual Info: Quality & Reliability Guide February 2001 2001 Actel Corporation All Rights Reserved. Actel and the Actel logo are trademarks of Actel Corporation. All other brand or product names are the property of their respective owners. Contents 1. Overview of Actel’s Quality and Reliability Guide . . . . . . . . . . . . . . . . . . . .1

LM95A

Abstract: transistor a1020 Actel A1020 ACTEL A1010 Actel a1280 LM95 A1020 transistor actel a1020b ACTEL A1280A RT14100
Contextual Info: RADIATION PERFORMANCE OF ACTEL PRODUCTS J.J. Wang Technology Development Actel Corporation 408-522-4576 jih-jong.wang@actel.com Rev7 November 8, 2000 1 I. TOTAL IONIZING DOSE (TID) PERFORMANCE Table I list the TID data of Actel products published in the open domain. Also included is the availability of each product.

QFN108

Abstract: QFN-132 kl1-v1 208 pin rqfp drawing qfn132 RT3PE3000L CQ256 DIMENSIONS pqfp 100 actel package mechanical drawing Actel A40MX04 PBGA 23X23 0.8 pitch
Contextual Info: v 11. 2 Package Mechanical Drawings Ceramic Pin Grid Array 84-Pin CPGA Top View 0.050" ± 0.010" Pin #1 ID 0.045" 0.055" 0.015" 0.018" ± 0.002" 0.100" BSC 1.100" ± 0.020" square 0.072" 0.088" L 0.120" 0.140" Side View K J H G F 1.000" BSC E D C B A 1 2 3

Contextual Info: RadTolerant Field Programmable Gate Arrays Features • Programming Technology Prevents Reverse Engineering and Design Theft General Characteristics • • TestedTotal Ionizing Dose TID Survivability Level • Packages: 132-Pin, 172-Pin, 196-Pin, and 256-Pin Ceramic

RT54SX72SCQ208

Abstract: A42MX16 RT54SX32S-CQ208 CQ208 CQ256
Contextual Info: v3.0 Component Selector Guide PCI 5.0 Volt Tolerant — 5 Volt I/O — Yes Yes Yes — — Yes 3.3 Volt I/O 3,000 2.5 Volt I/O Gates 36 JTAG I/O User I/O C, I SRAM Bits Screening –F, Std, –P Wide Decodes Speed Grade CS49 Flip-Flops/Dedicated Max Package

A1010B

Abstract: Actel a54sx72a tid A54SX72A TID
Contextual Info: Actel FPGAs for Aerospace Applications When Failure is not an Option As a leading supplier of high reliability FPGAs, Actel offers programmable logic devices for a variety of high reliability applications ranging from commercial aviation and extreme environments to military

RT54SX72SCQ208

Abstract: rt1280 RT54SX32S-CQ208 RTSX72 RT1020-CQ84B aircraft logic gates RTSX72S RT1425 RT14100 RH1020-CQ84V
Contextual Info: Civilian/Scientific Exploration Actel FPGAs for Space Applications Uncompromising in the Extreme Deep Space I Device Speed Grade Gates Logic Modules Available I/Os DSCC SMD Mars Surveyor RadHard RH1020-CQ84V Std 4,000 547 69 5962F90965 RH1280-CQ172V Std 16,000

RT54SX32S-CQ208B

Abstract: RT54SX72SCQ208 RT1280A-CQ172 Actel A1020B RT54SX16S-CQ256B 30-80LET Single Event Latchup FPGA
Contextual Info: Actel FPGAs for Space Applications Uncompromising in the Extreme n n n n n Total Dose Capabilities from 5Krads to 1M rad Latch-up Immune Device Capacities from 4,000 to 72,000 Available Gates Highly Reliable, Non-Volatile Antifuse Technology Meets the Most Stringent Quality

Contextual Info: Æ ic te ! RadTolerant Field Programmable Gate Arrays - m Features • Programming Technology Prevents Reverse Engineering and Design Theft General Characteristics • • TestedTotal Ionizing Dose TID Survivability Level • Packages: 132-Pin, 172-Pin, 196-Pin, and 256-Pin Ceramic

Contextual Info: Æ ic t e ! v 3 .0 - m RadTolerant Field Programmable Gate Arrays Features • 100%Resource Utilization with 100%Pin-Locking General Characteristics • Secure Programming Technology Pre\ents Reverse Engineering and Design Theft

RT1280A-CQ172E

Abstract: RT1280A-CQ172 RT1280A
Contextual Info: RadTolerant Field Programmable Gate Arrays F e a tu re s • Secure Programming Technology Engineering and Design Theft G e n e r a l C h a r a c te r is t ic s Prevents Reverse • Permanently Programmed for Instantaneous Operation on Power-Up • Tested Total Ionizing Dose TID Survivability Level

RT1280A

Abstract: actel a1020b A1425A 2284r RT14100A CQFP 172 PIN A1020B
Contextual Info: v 3. 0 RadTolerant Field Programmable Gate Arrays Features General Characteristics • Tested Total Ionizing Dose TID Survivability Level • No Single Event Latch-up Below a Minimum LET Threshold of 80 MeV-cm2/mg for All RT Devices • Packages: 84-Pin, 132-Pin, 172-Pin, 196-Pin, and 256-Pin

13001 s

Abstract: 13001 datasheet 13001 JL-01 ACTEL 1020B RTSX32 B 13001 RTSX16 42MX09 1280A
Contextual Info: Actel 4th Quarter 2000 Reliability Report 1 Table of Contents Page Reliability Test Matrix • Test Methods and Conditions Failure Rates • Failure Rates FITs Based For Current Process Data • Mean Time Between Failure (MTBF) For Current Process Data 2

CQFP 256 PIN actel

Abstract: RT1280A A1280A VKS rt1280 A1020B ACTEL A1280A A1020 transistor A1280A-CQ172C RT1460 actel 172 cqfp
Contextual Info: v3.1 RadTolerant FPGAs Features General Characteristics • • • • • • Tested Total Ionizing Dose TID Survivability Level No Single Event Latch-Up Below a Minimum LET (Linear Energy Transfer) Threshold of 80 MeV-cm2/mg for All RT (RadTolerant) Devices

Pl84

Contextual Info: Component Selector Guide April 1999 1999 Actel Corporation 1 Package Speed Grade SRAM Bits JTAG I/O 3.3 Volt 5 Volt PCI 5.0 Volt Tolerant at 3.3V VQ100 Std, –1, –2, –3 78 8,000 256 512 — — Yes Yes — — Yes PQ208 Std, –1, –2, –3 129 8,000

actel cqfp 84

Abstract: actel a1020b RT1425A actel a1010b actel 172 cqfp
Contextual Info: Package Options: User I/Os per Package January 1999 1999 Actel Corporation 1 Commercial/Industrial Devices RQFP VQFP TQFP BGA CPGA CQFP 129 172 172 125 176 34 57 69 69 72 83 72 72 57 125 125 152 125 176 176 202 176 176 202 57 78 112 129 78 144 78 112 144

CQ256

Abstract: CQ208 CQ84 A32200DX PG176 RH1020B CQ196 CI624 A42MX36 dimensions A1240XL
Contextual Info: Actel Hermetic Package Mechanical Cavity, weight, Lid size and Heat Sink size configuration Package Devices Cavity CQ84 CQ84 CQ84 CQ84 A1020B RT1020B RH1020B A32100DX Up Up Up Up Weight (grams) 2.2 2.2 2.2 2.2 Lid (mils) 520x520 520x520 520x520 550x550 Head Sink

CQFP 256 PIN actel

Abstract: ACTEL A1280A
Contextual Info: v3.1 RadTolerant FPGAs Features General Characteristics • • • • • • Tested Total Ionizing Dose TID Survivability Level No Single Event Latch-Up Below a Minimum LET (Linear Energy Transfer) Threshold of 80 MeV-cm2/mg for All RT (RadTolerant) Devices