JESD22A110 Search Results

JESD22-B102-C

Abstract: SOT-86 sot86 transistor c 5586 q404 transistor SGA-6486Z SGA-6286 JESD22-B102C q402 transistor transistor 5586
Contextual Info: Reliability Report SGA/SGC Series in SOT-86 Package SnPb Plated SGA-2186 SGA-2286 SGA-2386 SGA-2486 SGA-3286 SGA-3386 SGA-3486 SGA-3586 SGA-4186 SGA-4286 SGA-4386 SGA-4486 SGA-4586 SGA-5286 SGA-5386 SGA-5486 SGA-5586 SGA-6286 SGA-6386 SGA-6486 Matte Sn, RoHS Compliant

ESD test plan

Abstract: CGA-0116 0116 led JESD22-A103 1100C JESD22-A114 RQR-103796 1500C
Contextual Info: Reliability Conditional Qualification Report CGA-0116 303 S. Technology Ct, Broomfield CO, 80021 Phone: 800 SMI-MMIC http://www.sirenza.com Document RQR-103796 Rev A 1 CGA-0116 Reliability Qualification Report I. Qualification Overview The CGA-0116 family of products has demonstrated reliable operation by passing all

SBW5089

Abstract: JESD22-A110 sirenza microdevice sot-89 TRANSISTOR a105 JESD22-A113 JESD22-A114 SBA-4089 SBA-5089 SBF-4089 SBF-5089
Contextual Info: Reliability Qualification Report SBA-5089 Products Qualified by Similarity SBA-4089 SBF-5089 SBF-4089 Initial Qualification 303 S. Technology Ct, Broomfield CO, 80021 SBW-5089 7-2003 Phone: 800 SMI-MMIC http://www.sirenza.com Document RQR-103306- Rev. D

S510068-28Z

Abstract: s5100 JESD22-A104B JESD22-A108B JESD22-A114 JESD78
Contextual Info: Reliability Qualification Report S510068-28Z - RoHS Compliant Products Qualified by Similarity S510069-28Z The information provided herein is believed to be reliable at press time. Sirenza Microdevices assumes no responsibility for inaccuracies or omissions. Sirenza Microdevices assumes no responsibility for the use of this information, and all such information shall

STQ2016Z

Abstract: JESD22-A104B SRF-2016Z JESD22-A110 SRF-1016Z SRQ-2116Z STQ-1016Z STQ-2016Z STQ-3016Z TSSOP-16
Contextual Info: Reliability Qualification Report STQ-2016Z - Matte Sn, RoHS compliant Products Qualified by Similarity STQ-1016Z SRF-1016Z SRQ-2116Z STQ-3016Z SRF-2016Z The information provided herein is believed to be reliable at press time. Sirenza Microdevices assumes no responsibility for

JESD22-A102C

Abstract: JESD22-A104B SGB-6433Z SGB-4533Z SGB-6533 SGB-2233Z JESD22-A-104B JESD22-A113C SGB-6433 SGB-6533Z
Contextual Info: Reliability Qualification Report SGB-6533 - SnPb Plated SGB-6533Z - Matte Sn, RoHS Compliant Products Qualified by Similarity SGB-2233 SGB-2433 SGB-2233Z SGB2433Z SGB-4333 SGB-4533 SGB-6433 SGB-4333Z SGB-4533Z SGB-6433Z The information provided herein is believed to be reliable at press time. Sirenza Microdevices assumes no responsibility for

SBB-2089Z

Abstract: sbb2089z SBB5089 SBB-4089 darlington pair transistor SBB-2089 SBB-3089 SBB2089 SBB-1089 SBB5089Z
Contextual Info: Reliability Qualification Report SBB-2089Z Products Qualified by Similarity SBB-1089 SBB-1089Z SBB-3089Z SBB-4089Z SBB-5089Z CGB-1089Z SBB-2089 SBB-4089 SBB-5089 Initial Qualification Feb 2005 Additional HAST June 2005 The information provided herein is believed to be reliable at press time. RFMD assumes no responsibility for inaccuracies or omissions.

SPF-5043Z

Abstract: spf5043z spf-5043 5043Z SPF 5043Z JESD22-A104B JESD22-A108B JESD22-A114 JESD22-A-108-B SOT343 lna
Contextual Info: Reliability Qualification Report SPF-5043Z - Matte Sn, RoHS Compliant The information provided herein is believed to be reliable at press time. Sirenza Microdevices assumes no responsibility for inaccuracies or omissions. Sirenza Microdevices assumes no responsibility for the use of this information, and all such information shall

SPF-5122Z

Abstract: spf-5122 SPF5122z precondition DIP JEDEC spf 5122 JESD22-A104B JESD22-A108B JESD22-A114 ESD test plan JESD22-B102C
Contextual Info: Reliability Qualification Report SPF-5122Z - Matte Sn, RoHS Compliant The information provided herein is believed to be reliable at press time. Sirenza Microdevices assumes no responsibility for inaccuracies or omissions. Sirenza Microdevices assumes no responsibility for the use of this information, and all such information shall

SGA6489Z

Abstract: IC 7489 JESD22-B102-C SGA6389Z SGA-5589Z SGA-7489 SGA-6489 SGA-9289Z SGA9189Z SGC-6489
Contextual Info: Reliability Report SGA/SGC Series in SOT-89 Package SnPb Plated SGA-5289 SGA-5389 SGA-5489 SGA-5589 SGA-6289 SGA-6389 SGA-6489 SGA-6589 SGA-7489 SGA-9089 SGA-9189 SGA-9289 Matte Sn, RoHS Compliant SGA-5289Z SGA-5389Z SGA-5489Z SGA-5589Z SGA-6289Z SGA-6389Z

JESD22-A110-B HIGHLY ACCELERATED TEMPERATURE AND

Contextual Info: V•I Chip – BCM Bus Converter Module TM B048K480T30 + + –K – • >97% efficiency • 300 Watt 450 Watt for 1 ms • 125°C operation • High density – up to 1165 W/in3 • <1 µs transient response • Small footprint – 280 W/in • >3.5 million hours MTBF

transistor af 126

Abstract: JESD22-B-107-A J-STD-029 mount chip transistor 332
Contextual Info: V•I Chip – BCM Bus Converter Module TM B048K120T20 Vin = 42 - 53 V Vout = 10.5 - 13.25 V Iout = 17.0 A K = 1/4 Rout = 25 mΩ max • 48V to 12V V•I Chip Converter • >96% efficiency • 200 Watt 300 Watt for 1 mS • 125°C operation • High density – up to 800 W/in3

JESD22-A108

Abstract: JESD22*108
Contextual Info: AOS Semiconductor Product Reliability Report AO3421E, rev A Plastic Encapsulated Device ALPHA & OMEGA Semiconductor, Inc www.aosmd.com This AOS product reliability report summarizes the qualification result for AO3421E. Accelerated environmental tests are performed on a specific sample size, and then followed

PPAP level submission requirement table

Abstract: PPAP MANUAL for automotive industry foundry metals quality MANUALS result of 200 prize bond INCOMING MATERIAL INSPECTION checklist, PCB TSMC 90nm sram SMD a006 ISO 9001 Sony foundry INCOMING MATERIAL INSPECTION procedure INCOMING RAW MATERIAL INSPECTION procedure
Contextual Info: Contents Contents i Chapter 1 Quality Management 1.1 Quality Policy 1.2 Quality Organization 1.3 ISO 9001 Year 2000 Revision 1.4 Quality Systems 1.4.1 Process Map 1.4.2 Advanced Product Quality Planning 1.4.3 Quality Assurance in the Project Approval Stage

JESD22-A-103A

Abstract: jesd22-a-104B JESD22 A-102 JESD22-A-101 JESD22-B-107-A converter 48 to 24 switching
Contextual Info: PRELIMINARY V•I Chip Bus Converter Module BCM V•I Chip – BCM Bus Converter Module TM B048K480T30 K indicates BGA configuration. For other mounting options see Part Numbering below. • 48 V to 48 V V•I Chip Converter • Typical efficiency 96% • 300 Watt 450 Watt for 1 ms

Contextual Info: Product Qualification Package CGD1042H 1 GHz, 23 dB Gain high output power doubler Rev. 01 — November 30, 2009 Document information Info Content Keywords Product Qualification Package Abstract This document presents the characteristics of CGD1042H power doubler

48V-to-12V

Abstract: smd TRANSISTOR marking T1
Contextual Info: V•I Chip – BCM Bus Converter Module TM B048K120T15 Vin = 42 - 53 V Vout = 10.5 - 13.25 V Iout = 12.5 A K = 1/4 Rout = 32 mΩ max • 48V to 12V V•I Chip Converter • >96% efficiency • 150 Watt 225 Watt for 1 ms • 125°C operation • High density – up to 600 W/in3

Contextual Info: Product Qualification Package CGY888C 34 dB, 870 MHz GaAs push-pull forward amplifier Rev. 02 — December 29, 2009 Document information Info Content Keywords Product Qualification Package Abstract This document presents the characteristics of CGY888C push pull CATV

IPC 9701

Abstract: transistor marking JB
Contextual Info: BCM V•I Chip – BCM Bus Converter Module TM B048K480T30 K indicates BGA configuration. For other mounting options see Part Numbering below. • 48 V to 48 V V•I Chip Converter • >97% efficiency • 300 Watt 450 Watt for 1 ms • 125°C operation + +

Contextual Info: Qualification and Reliability Report Series: EQTB73 Qualification Tests Test Aging Autoclave ESD Susceptibility Flammability Hermeticity – Fine Leak Hermeticity – Gross Leak High Temperature Operating Life High Temperature Storage Highly Accelerated Temperature

Contextual Info: Qualification and Reliability Report Series: EQVD13 Qualification Tests Test Aging Autoclave ESD Susceptibility Flammability Hermeticity – Fine Leak Hermeticity – Gross Leak High Temperature Operating Life High Temperature Storage Highly Accelerated Temperature

Contextual Info: Qualification and Reliability Report Series: EH56 Qualification Tests Test Aging Autoclave ESD Susceptibility Flammability Hermeticity – Fine Leak Hermeticity – Gross Leak High Temperature Operating Life High Temperature Storage Highly Accelerated Temperature

JESD22-B116

Abstract: MIL-STD-883 method 2019 JESD22-A110 MIL-STD-883 PRESSURE JESD22A110
Contextual Info: Integrated Device Technology, Inc. 2975 Stender Way, Santa Clara, CA - 95054 PRODUCT/PROCESS CHANGE NOTICE PCN 7/31/2000 PCN #: L0007-04 DATE: Product Affected: 74LVC16244, 74LVC16245 74LVCH162244 Manufacturing Location Affected: IDT Salinas Fab Date Effective:

Contextual Info: Qualification and Reliability Report Series: E13C5 Qualification Tests Test Aging Autoclave ESD Susceptibility Flammability Hermeticity – Fine Leak Hermeticity – Gross Leak High Temperature Operating Life High Temperature Storage Highly Accelerated Temperature