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    ENDURANCE TEST REPORT Search Results

    ENDURANCE TEST REPORT Result Highlights (5)

    Part ECAD Model Manufacturer Description Download Buy
    FO-62.5LPBMT0-001 Amphenol Cables on Demand Amphenol FO-62.5LPBMT0-001 MT-RJ Connector Loopback Cable: Multimode 62.5/125 Fiber Optic Port Testing .1m Datasheet
    FO-9LPBMTRJ00-001 Amphenol Cables on Demand Amphenol FO-9LPBMTRJ00-001 MT-RJ Connector Loopback Cable: Single-Mode 9/125 Fiber Optic Port Testing .1m Datasheet
    SF-SFP28LPB1W-3DB Amphenol Cables on Demand Amphenol SF-SFP28LPB1W-3DB SFP28 Loopback Adapter Module for SFP28 Port Compliance Testing - 3dB Attenuation & 1W Power Consumption Datasheet
    FO-50LPBMTRJ0-001 Amphenol Cables on Demand Amphenol FO-50LPBMTRJ0-001 MT-RJ Connector Loopback Cable: Multimode 50/125 Fiber Optic Port Testing .1m Datasheet
    SF-SFPPLOOPBK-003.5 Amphenol Cables on Demand Amphenol SF-SFPPLOOPBK-003.5 SFP+ Loopback Adapter Module for SFP+ Port Compliance Testing - 3.5dB Copper/Optical Cable Emulation Datasheet

    ENDURANCE TEST REPORT Datasheets Context Search

    Catalog Datasheet MFG & Type Document Tags PDF

    transistor poly3

    Abstract: RR510 RR-504 RR-520 X28C256 rr520
    Text: Xicor Endurance Report Xicor Endurance Report RR-520 H. A.R. Wegener INTRODUCTION This report describes endurance relating to Xicor’sproducts employing the Direct WriteTM cell. These devices display enhanced endurance cycling characteristics that are attributable to the direct write cell, process


    Original     		RR-520 RR-504 000PageCycles transistor poly3 RR510 RR-504 RR-520 X28C256 rr520 PDF

    TA-NWT-000983

    Abstract: Mil-Std-883D SG608 CDX2155 CDX2622 SDX1155 UL-94-VO mil-std 883d method 1010 MILSTD-883D
    Text: Interim Qualification Report 2000 Hours Endurance Reliability Data CDX2155, CDX2622 Summary The CDX2155 and CDX2622 transceivers have been successfully qualified in accordance with the requirements of Bellcore document TA-NWT-000983, under the supervision of HewlettPackard FCO Quality and


    Original     		CDX2155, CDX2622 CDX2155 TA-NWT-000983, CDX2622 TA-NWT-000983. MIL-STD-202 PSE6256/05 TA-NWT-000983 Mil-Std-883D SG608 SDX1155 UL-94-VO mil-std 883d method 1010 MILSTD-883D PDF

    sd667

    Abstract: SE621 FDX1125B SDX1155 SDX1155B UL-94-VO IEC-68-2-20 TA-NWT-000983 se6303 SE6211
    Text: Interim Qualification Report 2000 Hours Endurance Reliability Data SDX1155B, FDX1125B Summary This report summarizes the Qualification testing of both the SDX1155B and FDX1125B over a range of environmental and mechanical extremes as set out in Bellcore TA-NWT-000983. All


    Original     		SDX1155B, FDX1125B SDX1155B FDX1125B TA-NWT-000983. int06 SD668107 SD668110 sd667 SE621 SDX1155 UL-94-VO IEC-68-2-20 TA-NWT-000983 se6303 SE6211 PDF

    CTL4468-002

    Abstract: lbff 1408150-1
    Text: 501-672 Qualification Test Report 30Jan08 Rev A Series MMCX 50 Ohm Micro-Miniature Connectors 1. INTRODUCTION 1.1. Purpose Testing was performed on the Tyco Electronics Series MMCX 50 ohm micro-miniature connectors to determine their conformance to the requirements of Product Specification 108-2084 Revision A.


    Original     		30Jan08 28Mar07 18Feb08. CTL4468-002 EME4468-003. lbff 1408150-1 PDF

    GP035

    Abstract: CF-110VH-2A PCN-112D3MHZ PCN-104 118D3 PCN-103D3MHZ PCN-103D3M PMC35 CF-110VH GP-035
    Text: Qualification Test Report 認定試験報告書 501-79817 Was S-45624~45645 October 23, 2007 Rev. A1 PCＮ-D3M リレー PCＮ-D3M Relay １.はじめに Introduction 1.1 目 的 Purpose 本試験はリレー製品規格書 108-79817 Rev. A に規定された性能必要条件に合致しているか


    Original     		S-45624 100mA) DC500V 900VAC/Sec 600VAC/Sec GP035 CF-110VH-2A PCN-112D3MHZ PCN-104 118D3 PCN-103D3MHZ PCN-103D3M PMC35 CF-110VH GP-035 PDF

    sim reader

    Abstract: sim card chips 292405-1 ASHL-0004-ES
    Text: Qualification Test Report 501-5476 Rev. O1 Product Specification : 108-5826 Reference Test Report No. : TR100395 Date : 26Mar2003 Classification : Unrestricted Prepared by C.OHASHI PE Reviewed by PE Manager Approved by QA Manager NO Tyco Electronics AMP Shanghai Ltd.


    Original     		TR100395 26Mar2003 D20051207013501 ASHL-0004-ES 07Nov05 26Mar03 sim reader sim card chips 292405-1 PDF

    IEC 61754-20

    Abstract: dust cap LC EIA-526-14A EIA-455 Bly 53
    Text: Qualification Test Report 501-700 30Apr09 Rev A LC Duplex Sealed Plug and Receptacle Singlemode and Multimode Connectors ODVA Conforming 1. INTRODUCTION 1.1. Purpose Testing was perform ed on Tyco Electronics Fiber Optic LC Duplex Sealed Plug and Receptacle


    Original     		30Apr09 IEC 61754-20 dust cap LC EIA-526-14A EIA-455 Bly 53 PDF

    1746854-1

    Abstract: tyco Qualification Test Report
    Text: Qualification Test Report 認定試験報告書 シールドフィンガー2411 （ 1. はじめに 1.1 目 501-5816 6MAR’07 Rev. A Shield Finger2411） 的 本試験はシールドフィンガー 2411の、製品規格 108-5967-2 Rev.A に規定された性能必要条件に合致し


    Original     		Finger2411 29-JAN-2007 6-MAR-2007. 1746854-1 tyco Qualification Test Report PDF

    OJ-SH-112LMH

    Abstract: IEC60255 GP035
    Text: Qualification Test Report 501-79075 Was S-36091~36112 認定試験報告書 2 October 2007 Rev. A OJ-SH-112LMH リレー OJ-SH-112LMH Relay １.はじめに Introduction 1.1 目 的 Purpose 本試験はリレー製品規格書 108-79075 Rev. O1 に規定された性能必要条件に合致しているか


    Original     		S-36091 OJ-SH-112LMH OJ-SH-112LMH 100Mohm DC500V AC900V AC4800V FK00-0022-04 IEC60255 GP035 PDF

    MIL-C-675C

    Abstract: alcohol sensor data sheet 3M Touch Systems ASTM-D-1308-87 capacitive touchscreen MIL-C-675-C alcohol sensor Gardner touch screen 3M hardness tester
    Text: Technical Data ClearTek Capacitive Touch Screens ELECTRICAL Input Method Finger. TouchPen available with qualified sensor, attachments and electronics Accuracy and Precision Area Reported touch coordinates are within 1.0% of true position based on viewing area dimensions when linearized


    Original     		MIL-STD-810E) PA-2197 MIL-C-675C alcohol sensor data sheet 3M Touch Systems ASTM-D-1308-87 capacitive touchscreen MIL-C-675-C alcohol sensor Gardner touch screen 3M hardness tester PDF

    PCD-124-D2M

    Abstract: IEC60255 koike relays GP035 hp410
    Text: Qualification Test Report 認定試験報告書 501-79726 Was S-45668～45689 5 October 2007 Rev. A PCD-124D2M リレー PCD-124D2M Relay １.はじめに Introduction 1.1 目 的 Purpose 本試験はリレー製品規格書 108-79726 Rev. O に規定された性能必要条件に合致しているか


    Original     		S-4566845689 PCD-124D2M PCD-124D2M 100Mohm DC500V AC1200V AC4800V FK00-0114-04 PCD-124-D2M IEC60255 koike relays GP035 hp410 PDF

    koike relays

    Abstract: IEC60255 TOS8700 GP035 VH-6200 hp410
    Text: Qualification Test Report 501-79386 Was S-15772 ~ 15793 2 October 2007 Rev. A 認定試験報告書 ＰＣＦ-１２４Ｄ２Ｍ リレー PCF-124D2M Relay １.はじめに Introduction 1.1 目 的 Purpose 本試験はリレー製品規格書 108-79386 Rev. O1 に規定された性能必要条件に合致しているか


    Original     		S-15772 PCF-124D2M 100Mohm DC500V AC1200V AC6000V EC-FK00-0022-04 koike relays IEC60255 TOS8700 GP035 VH-6200 hp410 PDF

    IEC60255

    Abstract: koike relays GP035 Qualification Test Report
    Text: Qualification Test Report 認定試験報告書 501-79725 Was S-45694～45715 5 October 2007 Rev. A PCD-112D2M リレー PCD-112D2M Relay １.はじめに Introduction 1.1 目 的 Purpose 本試験はリレー製品規格書 108-79725 Rev. O に規定された性能必要条件に合致しているか


    Original     		S-4569445715 PCD-112D2M PCD-112D2M 100Mohm DC500V AC1200V AC2400V FK00-0114-04 IEC60255 koike relays GP035 Qualification Test Report PDF

    PCJ-112D3MH

    Abstract: IEC60255 GP035 2502A koike relays s3598
    Text: Qualification Test Report 501-79544 Was S-35983~36004 3 October 2007 Rev. A 認定試験報告書 PCJ-112D3MH リレー PCJ-112D3MH Relay １.はじめに Introduction 1.1 目 的 Purpose 本試験はリレー製品規格書 108-79544 Rev. O に規定された性能必要条件に合致しているか


    Original     		S-35983 PCJ-112D3MH PCJ-112D3MH 100Mohm DC500V AC900V AC4800V FK00-0022-04 IEC60255 GP035 2502A koike relays s3598 PDF

    koike relays

    Abstract: IEC60255 GP035
    Text: Qualification Test Report 501-79449 Was S-25869～25890 3 October 2007 Rev. A 認定試験報告書 SDT-S-106LMR2 リレー SDT-S-106LMR2 Relay １.はじめに Introduction 1.1 目 的 Purpose 本試験はリレー製品規格書 108-79449 Rev. O1 に規定された性能必要条件に合致しているか


    Original     		S-2586925890 SDT-S-106LMR2 SDT-S-106LMR2 100Mohm DC500V AC1200V AC4800V FK00-0067-04 koike relays IEC60255 GP035 PDF

    NF C 32-070

    Abstract: HP901 RB109 visual inspection of raw materials
    Text: Tyco Electronics Corporation 300 Constitutional Drive Menlo Park, CA. 94025 U.S.A. Raychem No: Rev: Date: Page RB-109 F December 14, 2005 1 of 15 SolderSleeve Devices Specification For Commercial Wire Splices Table of Contents Chapter Pages 1.0 1.1 1.2 General Requirements


    Original     		RB-109 NF C 32-070 HP901 RB109 visual inspection of raw materials PDF

    JESD78

    Abstract: No abstract text available
    Text: 5/24/2006 PRODUCT RELIABILITY REPORT FOR MAXQ2000 Rev A3 Dallas Semiconductor 4401 South Beltwood Parkway Dallas, TX 75244-3292 Prepared by: Mark Kwist Sr. Reliability Engineer Dallas Semiconductor 4401 South Beltwood Pkwy. Dallas, TX 75244-3292 Email : mark.kwist@dalsemi.com


    Original     		MAXQ2000 JESD78 PDF

    25640A

    Abstract: AT35532 AT35000 AT25640 AT25640A endurance test report
    Text: AT25640A AT35532 SPI EEPROM Product Qualification • 2325 Orchard Parkway • San Jose CA 95131 • The AT25640A Serial Peripheral Interface EEPROM is fabricated on the AT35000 CMOS process. With the exception of HBM ESD, all tests were performed at Atmel’s


    Original     		AT25640A AT35532) AT25640A AT35000 AT35000 AT25640A. AT35532 2h0487 25640A AT25640 endurance test report PDF

    QCI-30521

    Abstract: Moisture Sensitivity Levels MICROCHIP PIC Package AEC-A100 automotive handbook by bosch Delco Electronics bosch automotive bosch sm drive Delco mechanical engineering project Microchip Product Line Card
    Text: MICROCHIP OVERVIEW, QUALITY SYSTEMS AND CUSTOMER INTERFACE SYSTEMS HANDBOOK 2001/2002 The Embedded Control Solutions Company CONTENTS Introduction. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4 Core Business Culture Mission Statement . . . . . . . . . . . . . . . . . . . . . . . . . 5


    Original     		DS00169B QCI-30521 Moisture Sensitivity Levels MICROCHIP PIC Package AEC-A100 automotive handbook by bosch Delco Electronics bosch automotive bosch sm drive Delco mechanical engineering project Microchip Product Line Card PDF

    D35WN-3P3M

    Abstract: No abstract text available
    Text: 11/28/2005 PRODUCT RELIABILITY REPORT FOR DS2460, Rev A2 Dallas Semiconductor 4401 South Beltwood Parkway Dallas, TX 75244-3292 Prepared by: Don Lipps Staff Reliability Engineer Dallas Semiconductor 4401 South Beltwood Pkwy. Dallas, TX 75244-3292 Email : don.lipps@dalsemi.com


    Original     		DS2460, D35WN-3P3M PDF

    RR502A

    Abstract: RR504 x2864 X2864A X2816A RR-504 predicting xicor X2816A
    Text: U ff !' VH I I I I iiJ r r* > 3* / y h \ 'i DETERMINING SYSTEM RELIABILITY FROM E2PROM ENDURANCE DATA By Richard Palm • D ata retention refers to the capability of a non­ volatile m emory device to retain valid data under worst case conditions. Xicor has published numerous reliability reports


    OCR Scan     		X2816A X2864A. X2864A RR502A RR504 x2864 RR-504 predicting xicor X2816A PDF

    Untitled

    Abstract: No abstract text available
    Text: EEPROM Reliability The reliability of AMD's NS-18 process used in the fabrication of 64K EEPROMs is described in this report. The reliability monitors used at AMD were designed to predict the future operating life results by accelerat­ ing failure rates. The monitors include data from endur­


    OCR Scan     		NS-18 Am2864AE/BE Am2864B PDF

    X28C64

    Abstract: X28C256 ucl 11 A12C UCl 21
    Text: RR-511 W 0114-1 X 2 8 C 6 4 /X 2 8 C 2 5 6 RELIABILITY REPORT 10-1 INTRODUCTION The X28C64 and X28C 256 are nonvolatile bytewide E2PROM s configured as 8K x 8 and 32K x 8 respectively. Both devices are com pliant with the JEDEC approved pinout for byte-w ide m em ories.


    OCR Scan     		X28C64/X28C256 X28C64 X28C256 64-byte 330ii X28C64. X28C64/X28C256 X28C64: ucl 11 A12C UCl 21 PDF

    Untitled

    Abstract: No abstract text available
    Text: 1K Commercial X2212A 2 5 6 x 4 Bit Nonvolatile Static RAM FEATURES • Single 5V Supply • Fully TTL Compatible • JEDEC Standard 18-Pin Package • Infinite E2PROM Array Recall, RAM Read and Write Cycles • Access Time of 250 ns Max. • Nonvolatile Store Inhibit: Vcc = 3V Typical


    OCR Scan     		X2212A 18-Pin RR-504, PDF