sd667
Abstract: SE621 FDX1125B SDX1155 SDX1155B UL-94-VO IEC-68-2-20 TA-NWT-000983 se6303 SE6211
Text: Interim Qualification Report 2000 Hours Endurance Reliability Data SDX1155B, FDX1125B Summary This report summarizes the Qualification testing of both the SDX1155B and FDX1125B over a range of environmental and mechanical extremes as set out in Bellcore TA-NWT-000983. All
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SDX1155B,
FDX1125B
SDX1155B
FDX1125B
TA-NWT-000983.
int06
SD668107
SD668110
sd667
SE621
SDX1155
UL-94-VO
IEC-68-2-20
TA-NWT-000983
se6303
SE6211
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SE6211
Abstract: se6303
Text: W hatHEW LETT mL'HM PACKARD Interim Qualification Report 2000 hours Endurance Reliability Data SDX1155B, FDX1125B Summary This report summarizes the Qualification testing of both the SDX1155B and FDX1125B over a range of environmental and mechanical extrem es as set out in
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SDX1155B,
FDX1125B
SDX1155B
TheFDX1125B
SDX1155B.
TA-NWT-000983.
perfo68
SE6211
se6303
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sx3704
Abstract: AP239 Transistor 80139 8C547 6C131C IN2222A 2N50B 2N2064 radio AC176 AC126 sft353
Text: INTERNATIONAL TRANSISTOR EQUIVALENTS GUIDE A LSO BY THE S A M E AUTHOR BP108 International Diode Equivalents Guide BP140 Digital IC Equivalents and Pin Connections BP141 Linear IC Equivalents and Pin Connections ALSO OF INTEREST BP234 Transistor Selector Guide
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SE6211
Abstract: RSE635204 SE630505
Text: ma I H EW L E T T K firn P A C K A R D Interim Qualification Report 2000 Hours Endurance Reliability Data SDX1155B, FDX1125B Summary This report summarizes the Qualification testing of both the SDX1155B and FDX1125B over a range of environmental and mechanical extremes as set out
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SDX1155B,
FDX1125B
SDX1155B
FDX1125B
TA-NWT-000983.
PSD697201
PSD697202
SE6211
RSE635204
SE630505
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