PREDICTING Search Results

ADSP-215xx

Abstract: TMS320DA250 addressing modes of adsp 21xx processors vhdl code for systolic iir filter TMS320DRE200 tms320f2812 addressing modes adsp215xx TMS320C4X ARCHITECTURE, ADDRESSING MODES TMS320DSC21 verilog code for speech recognition
Contextual Info: 2002 DSP directory Image by Mike O’Leary MARKET ANALYSIS FORECASTS DSP SALES TO TURN UPWARD IN 2002, WITH ISUPPLI PREDICTING A 4% RISE AND FORWARD CONCEPTS EXPECTING A 32% GAIN. By Robert Cravotta, Technical Editor www.ednmag.com LAST YEAR WAS A HARSH ONE for

HSP43220

Abstract: ASSP29
Contextual Info: Harris Semiconductor No. AN9403 Harris Digital Signal Processing November 1994 PREDICTING DATA THROUGHPUT IN THE HARRIS HSP43220 Authors: John Stauber, Picker International Perry Frogge, Harris Semiconductor Introduction Many signal processing applications require a filter which

Contextual Info: GaAs Resistor Model Predicting Harmonic, Transient and Breakdwon Yu Zhu, Cejun Wei, Oleksiy Klimashov, Hong Yin, Cindy Zhang, and Dylan Bartle Skyworks Solutions Inc. 20 Sylvan Rd, Woburn, MA 01801 U.S.A yu.zhu@skyworksinc.com Abstract—A comprehensive nonlinear model of GaAs resistor is

ze 003 driver

Abstract: ze 003 Excel formula erg inc 1962 heat and mass transfer
Contextual Info: AND8222/D Predicting the Effect of Circuit Boards on Semiconductor Package Thermal Performance http://onsemi.com Prepared by: Roger Paul Stout, PE ON Semiconductor APPLICATION NOTE Abstract In some situations, a circuit board may be approximated by varying regions of roughly axisymmetric geometry, and a

HSP43220

Contextual Info: Predicting Data Throughput In The Intersil HSP43220 TM Application Note January 1999 Introduction AN9403.1 The Intersil HSP43220 is a two stage Decimating Digital filter or 00F. It is designed for applications requiring a high input sample rate and a low output rate see Figure 1 . The

432E-3

Abstract: 57E6 Transistor 65e8 65e9 transistor 606E6 464E-5 65e9 968e 270E7 160E4
Contextual Info: Application Note Calculating Mean Time Between Failure for Discrete LEDs and Photodiodes MTBF FOR DISCRETE LEDS AND PHOTODIODES The calculation of Mean Time Between Failure MTBF is often required as an aid in predicting the reliability of electronic equipment under different operating conditions.

HSP43220

Contextual Info: [ /Title Predicting Data Throug hput In The Intersil HSP43 220 /Subject (AN94 03) /Autho r () /Keywords () /Creator () /DOCI NFO pdfmark [ /PageMode /UseOutlines /DOCVIEW pdfmark Predicting Data Throughput In The Intersil HSP43220 TM Application Note January 1999

1RF150

Abstract: AN-947 equivalent AN-947 10CGD capax Pelly 1c7 diode v1035a I435
Contextual Info: A P P L IC A T I O N N O T E 947 Understanding HEXFET Switching Performance B y S. Clemente, B.R. Pelly, A. Iild o rl Abstract A simple analytical technique for predicting the switching perform ance of the H E X F E T is presented. O osed-form solutions for the gate voltage, drain current, and

BAR66

Abstract: BA592 BA595 BA597 BA885 BAR14 BAR63-03W BAR64 BAR65-03W
Contextual Info: Application Note No. 058 Silicon Discretes Dr. Reinhard Gabl Predicting Distortion in Pin-Diode Switches This note describes the origin of distortion in pin-diode switches. Distortion is related to physical parameters of the diode and operating conditions and thus can be minimized by an appropriate diode

microsim

Abstract: VC53 MACROMODEL Macromodels
Contextual Info: Linear Products Operational Amplifier Macromodels increased, these advancements have been overshadowed by the need to simulate more complex systems. As systems become more complex, ways of predicting their performance become essential. TI Macromodels provide one avenue for getting a

HSP43220

Contextual Info: [ /Title Predicting Data Throug hput In The Intersil HSP43 220 /Subject (AN94 03) /Autho r () /Keywords () /Creator () /DOCI NFO pdfmark [ /PageMode /UseOutlines /DOCVIEW pdfmark Predicting Data Throughput In The Intersil HSP43220 Application Note January 1999

ACTEL A1010

Abstract: A1460 A1020 transistor AC109 A1010 A1415 A1425 A1440 actel a1240
Contextual Info: Application Note AC109 Predicting the Power Dissipation of Actel FPGAs Introduction Calculating the power dissipation of field programmable gate arrays FPGAs is similar to using the calculations for other CMOS ASIC devices, such as gate arrays and standard cells.

AN2657

Abstract: walkie-talkie NONLINEAR MODEL LDMOS military mobility DB-54003L-175 PD54003L-E T200 PD54003L microwave heating equations
Contextual Info: AN2657 Application note An innovative verilog model for predicting LDMOS DC, small and large signal behavior Introduction To reduce the design cycle time and cost for wireless applications it is useful to have models that can help RF Engineers predict and simulate the behavior of RF power transistors.

Contextual Info: OPTIMUM DESIGN AND SELECTION OF HEAT SINKS ‘, Seri Lee Aavid Engineering Inc. Laconia, New Hampshire 0 3 2 4 7 Abstract An analytical simulation model has been developed for predicting and optimizing the thermal performance of bidirectional fin heat sinks in a partiaHy confined configuration. Sample calculations are carried out, and parametric

65e7

Abstract: 74306 05-E7 715E6 69107 23e7 432E-3 421E-5 b-1 bomber 107E
Contextual Info: Application Note Calculating Mean Time Between Failure for Discrete LEDs and Photodiodes MTBF FOR DISCRETE LEDS AND PHOTODIODES The calculation of Mean Time Between Failure MTBF is often required as an aid in predicting the reliability of electronic equipment under different operating conditions.

LTE antenna design

Abstract: LTE rf front end power amplifier transceiver 4G LTE rffe LTE RF Multiband Ericsson Base Station 700mhz SP10T Peregrine Ericsson microwave antenna Ericsson 3G or LTE Module LTE impedance tuner
Contextual Info: RF & Microwave Designline October 2010 RF front end adapts for increased mobile data demand Tero Ranta, Duncan Pilgrim & Richard Whatley, Peregrine Semiconductor The industry is predicting that data volumes could reach 2.7 exabytes per year1 in 2010 and that

Contextual Info: Semiconductor I Predicting Data Throughput In The Harris HSP43220 A p p lic a t io n N o te J a n u a r y 19 99 A N 9403 .1 Introduction Many signal processing applications require a filter which can extract a narrow signal band from a wide band input. Satellite terminals, transmultiplexers, ultrasound equipment

THERMAL RUNAWAY IN RECTIFIER

Abstract: ez 806
Contextual Info: AND8223/D Predicting Thermal Runaway Prepared by: Roger Paul Stout, PE ON Semiconductor http://onsemi.com APPLICATION NOTE Abstract This monograph explains what thermal runaway is, some settings in which is it of concern and some in which it is not , and how to predict it. An archetypal “power law” device will

Contextual Info: AN1012 Application note Predicting the battery life and data retention period of NVRAMs and serial RTCs Introduction Standard SRAM devices have the advantage, over EEPROM and Flash memory, of high write-speed when used as main memory for a processor or microcontroller. Their

DS1216

Abstract: Electrolyte Evaporation Leg DS1340 battery controller 12AH-1 DS1682 rtc ds1307 BR1225 Electrolyte Evaporation BR2330
Contextual Info: Maxim > App Notes > MEMORY REAL-TIME CLOCKS TIME AND TEMPERATURE RECORDERS Keywords: lithium, battery, batteries, coin-cell, battery life, battery back up Mar 27, 2002 APPLICATION NOTE 505 Lithium Coin-Cell Batteries: Predicting an Application Lifetime Abstract: This application note discusses various contributors to battery capacity consumption in a batterybacked application, and how to predict battery lifetime in a system. A designer should be able to use this

Predicting-Operating-Temperature-and-Expected-Lifetime

Abstract: Predicting Operating Temperature and Expected Lifetime PCIM 177 variable capacitor C4AK powersystems simulation model electrolytic capacitor capacitor variable dw-dc variable capacitors
Contextual Info: Predicting Operating Temperature and Expected Lifetime of Aluminum-Electrolytic Bus Capacitors with Thermal Modeling Sam G. Parler, Jr. and Laird L. Macomber Cornell Dubilier 140 Technology Place Liberty, SC 29657 Abstract ! Large-can aluminum electrolytic capacitors are widely used as bus capacitors in variable-speed

st memory

Abstract: QNFL9901
Contextual Info: QNFL9901 QUALITY NOTE Predicting the Memory Data Retention Time This document describes how the prediction of the Data Retention Time is calculated, based on exhaustive tests of statistical samples. Arrhenius’s law states that, within certain limits, it is valid to test a semiconductor device for a short time

link budget calculation

Contextual Info: 26 Atmel Automotive Compilation, Vol. 6 Security Car Access Predicting RF Range Performance Ahmad Chaudhry, Jim Goings Overview For the automotive engineer using a d = distance separating transmitter RF field, nothing more. “Smart” data and receiver metric or English

Coffin-Manson Equation

Contextual Info: "Reliability and MTBF Overview" Prepared by Scott Speaks Vicor Reliability Engineering Introduction Reliability is defined as the probability that a device will perform its required function under stated conditions for a specific period of time. Predicting with some degree of