QNFL9901 Search Results

QNFL9901 Datasheets (1)

Part	ECAD Model	Manufacturer	Description	Curated	Datasheet Type	PDF
QNFL9901		STMicroelectronics	PREDICTING THE MEMORY DATA RETENTION TIME		Original	PDF

QNFL9901 Datasheets Context Search

Catalog Datasheet	Type	Document Tags	PDF
st memory Abstract: QNFL9901 Contextual Info: QNFL9901 QUALITY NOTE Predicting the Memory Data Retention Time This document describes how the prediction of the Data Retention Time is calculated, based on exhaustive tests of statistical samples. Arrhenius’s law states that, within certain limits, it is valid to test a semiconductor device for a short time	Original	QNFL9901 st memory QNFL9901	PDF
QNFL9901 Contextual Info: QNFL9901 QUALITY NOTE  Predicting the Memory Data Retention Time This document describes how the prediction of the Data Retention Time is calculated, based on exhaustive tests of statistical samples. Arrhenius’s law states that, within certain limits, it is valid to test a semiconductor device for a short time	Original	QNFL9901 QNFL9901	PDF

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st memory

Abstract: QNFL9901
Contextual Info: QNFL9901 QUALITY NOTE Predicting the Memory Data Retention Time This document describes how the prediction of the Data Retention Time is calculated, based on exhaustive tests of statistical samples. Arrhenius’s law states that, within certain limits, it is valid to test a semiconductor device for a short time

Original

QNFL9901 st memory QNFL9901

PDF

QNFL9901

Contextual Info: QNFL9901 QUALITY NOTE  Predicting the Memory Data Retention Time This document describes how the prediction of the Data Retention Time is calculated, based on exhaustive tests of statistical samples. Arrhenius’s law states that, within certain limits, it is valid to test a semiconductor device for a short time

Original

QNFL9901 QNFL9901

PDF