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    Cypress Semiconductor CY7C28650WMB

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    CY7C286 Datasheets (16)

    Part ECAD Model Manufacturer Description Curated Datasheet Type PDF
    CY7C286-50PC Cypress Semiconductor 64K x 8 Reprogrammable Asynchronous / Registered PROMs Scan PDF
    CY7C286-50WC Cypress Semiconductor 64K x 8 Reprogrammable Asynchronous / Registered PROMs Scan PDF
    CY7C286-60DMB Cypress Semiconductor 64K x 8 Reprogrammable Asynchronous / Registered PROMs Scan PDF
    CY7C286-60LMB Cypress Semiconductor 64K x 8 Reprogrammable Asynchronous / Registered PROMs Scan PDF
    CY7C286-60PC Cypress Semiconductor 64K x 8 Reprogrammable Asynchronous / Registered PROMs Scan PDF
    CY7C286-60QMB Cypress Semiconductor 64K x 8 Reprogrammable Asynchronous / Registered PROMs Scan PDF
    CY7C286-60WC Cypress Semiconductor 64K x 8 Reprogrammable Asynchronous / Registered PROMs Scan PDF
    CY7C286-60WMB Cypress Semiconductor 64K x 8 Reprogrammable Asynchronous / Registered PROMs Scan PDF
    CY7C286-70DMB Cypress Semiconductor 64K x 8 Reprogrammable Asynchronous / Registered PROMs Scan PDF
    CY7C286-70LMB Cypress Semiconductor 64K x 8 Reprogrammable Asynchronous / Registered PROMs Scan PDF
    CY7C286-70PC Cypress Semiconductor 64K x 8 Reprogrammable Asynchronous / Registered PROMs Scan PDF
    CY7C286-70QMB Cypress Semiconductor 64K x 8 Reprogrammable Asynchronous / Registered PROMs Scan PDF
    CY7C286-70WC Cypress Semiconductor 64K x 8 Reprogrammable Asynchronous / Registered PROMs Scan PDF
    CY7C286-70WMB Cypress Semiconductor 64K x 8 Reprogrammable Asynchronous / Registered PROMs Scan PDF
    CY7C286-80QMB Cypress Semiconductor 64K x 8 Reprogrammable Asynchronous / Registered PROMs Scan PDF
    CY7C286-80WMB Cypress Semiconductor 64K x 8 Reprogrammable Asynchronous / Registered PROMs Scan PDF

    CY7C286 Datasheets Context Search

    Catalog Datasheet Type Document Tags PDF

    Untitled

    Abstract: No abstract text available
    Text: CYPRESS b5E D SEMI CONDUCTOR • 25flRbb2 G Q l O S R b T13 ■ CYP CY7C286 CY7C287 S ;4 ^ s > c = f CYPRESS SEMICONDUCTOR 64K x 8 Reprogrammable Asynchronous/Registered PROMs • C ap ab le o f w ith stan d in g >2001V static d isch arg e • CMOS for optimum speed/power


    OCR Scan     		25flRbb2 CY7C286 CY7C287 7C287) 7C286) 7C287 7C286 PDF

    C286

    Abstract: CY7C287 CY7C286-70WC C2867 C2863 C2868
    Text: CY7C286 64K x 8 Reprogrammable PROM Features in the active mode and 40 mA in the standby mode. Access time is 45 ns. • CMOS for optimum speed/power • Windowed for reprogrammability • High speed — tAA = 45 ns • Low power — 120 mA active The CY7C286 is available in a cerDIP package equipped with


    Original     		CY7C286 CY7C286 28-Lead 600-Mil) C286 CY7C287 CY7C286-70WC C2867 C2863 C2868 PDF

    Untitled

    Abstract: No abstract text available
    Text: PRELIMINARY CYPRESS SEMICONDUCTOR 65,536 x 8 Reprogrammable Registered PROM Features Functional Description • CMOS for optimum speed/power T h e CY7C286 and the CY7C287 are highperform ance 65,536 by 8-bit CM O S PR O M s. T h e CY7C286 is configured in


    OCR Scan     		CY7C286 CY7C287 7C287) 7C286) 7C287 300-m PDF

    Untitled

    Abstract: No abstract text available
    Text: CY7C286 CY7C287 CYPRESS 65,536 x 8 Reprogrammable SEMICONDUCTOR Asynchronous/Registered PROMs Features Functional Description The CY7C286 and the CY7C287 are high-perfbrmance 65,536 by 8-bit CMOS PROMs. The CY7C286 is configured in the JEDEC-standard S12K EPROM pin­


    OCR Scan     		CY7C286 CY7C287 CY7C286 CY7C287 28-pin, 600-mil 7C286) PDF

    Untitled

    Abstract: No abstract text available
    Text: CY7C286 CY7C287 PR E LIM IN A R Y r^ Y p p u c c 65,536 x 8 PROM Reprogrammable Registered SEMICONDUCTOR Features Product Characteristics • CMOS for optimum speed/ power T h e C Y 7 C 2 8 6 a n d th e C Y 7 C 2 8 7 a re h ig h p e rfo rm a n c e 6 5 ,5 3 6 by 8 b it


    OCR Scan     		CY7C286 CY7C287 7C287) 7C286) 287-55PC 87-55W 287-65PC PDF

    A15C

    Abstract: CY7C287 CY7C287-55PC LCOS uv
    Text: CY7C286 CY7C287 Features • Capable of withstanding >2001V static discharge • CMOS for optimum speed/power • Windowed for reprogrammability Functional Description • High speed — tSA = 45 ns 7C287 — tco = 15 ns (7C287) — tACC = 50 ns (7C286)


    OCR Scan     		CY7C286 CY7C287 7C287) 7C286) 7C287 300-mil A15C CY7C287 CY7C287-55PC LCOS uv PDF

    I3330

    Abstract: No abstract text available
    Text: CY7C286 CY7C287 CYPRESS SEMICONDUCTOR 65,536 x 8 Reprogrammable Asynchronous/Registered PROMs & Features Functional Description • CMOS for optimum speed/power The CY7C286 and the CY7C287 are high-perfonnance 65,536 by 8 -bit CMOS PROMs. The CY7C286 is configured in


    OCR Scan     		CY7C286 CY7C287 CY7C287 28-pin, 600-mil 300-mil I3330 PDF

    Untitled

    Abstract: No abstract text available
    Text: CY7C286 CY7C287 Features • Capable of withstanding >2001V static discharge • CMOS for optimum speed/power • Windowed for reprogrammability Functional Description • High speed — tSA = 45 ns 7C287 — tco = 15 ns (7C287) — tACC = 50 ns (7C286)


    OCR Scan     		CY7C286 CY7C287 7C287) 7C286) 7C287 300-mil PDF

    EPM5128LC

    Abstract: EPM5128GC epm5064lc-1 EPM5128LC1 59628867809r 5962-8984106LX EPM5128GI 7C19945DMB EPM5130GC-1 5962-8867812rx
    Text: Product Line Cross Reference CYPRESS CYPRESS CYPRESS CYPRESS CYPRESS 5962-8753903LX 5962-8753902LX CY21L49-55C CY21L49-45C CY7C281 CY7C281A 5962-8863701LX 5962-8753902LX CY6116A-45C CY6116A-35C CY7C286 CY27H512 5962-8867003LX 5962-8867002LX CY6116A-55C CY6116A-45C


    Original     		5962-8753903LX 5962-8863701LX 5962-8867003LX 5962-8867809RX 5962-8867809XX 5962-8867810RX 5962-8867811RX 5962-8867812RX 5962-8871309RX 5962-8871310RX EPM5128LC EPM5128GC epm5064lc-1 EPM5128LC1 59628867809r 5962-8984106LX EPM5128GI 7C19945DMB EPM5130GC-1 PDF

    Untitled

    Abstract: No abstract text available
    Text: _ CY7C286 64K x 8 Reprogrammable PROM Functional Description Features • CMOS for optimum speed/power T he CY7C286 is a high-performance 64K x 8 CMOS PRO M . T he CY7C286 is con­ figured in the JE D E C -standard 512K E PR O M pinout and is available in a


    OCR Scan     		CY7C286 28-pin, 600-mil 32-pin PDF

    CY7C287

    Abstract: CY7C28x CY7C277
    Text: Qualification Report December, 1993, QTP 92441 Version 1.1 CY7C27x/CY7C28x FAB2 QUAL MARKETING PART NUMBER DEVICE DESCRIPTION CY7C271/274 32K x 8 PROM Power Switch and Reprogrammable CY7C277/279 Reprogrammable 32K x 8 Registered PROM CY7C285 CY7C286/287 64K x 8 Reprogrammable Fast Column Access PROM


    Original     		CY7C27x/CY7C28x CY7C271/274 CY7C277/279 CY7C285 CY7C286/287 CY7C277/CY7C287 256K/512KPROM 7C277-PC 256K/512K CY7C287 CY7C28x CY7C277 PDF

    ATPA

    Abstract: 7130SA100P 24l01 7C263/4-35C 7164S15Y cy9122-25 7133SA35J 7142sa55 7130sa55p cy2149-45c
    Text: Product Line Cross Reference CYPRESS CYPRESS CYPRESS CYPRESS CYPRESS CY2147-35C CY7C147-35C CY7C147-45C CY7C147-35C CY91L22-35C CY7C122-35C CY2147-45C CY2147-35C CY7C148-35C CY7C148-25C+ CY91L22-45C CY93L422AC CY2147-45C CY7C147-45C CY7C148-45C CY7C148-35C


    Original     		CY2147-35C CY7C147-35C CY7C147-45C CY91L22-35C CY7C122-35C CY2147-45C CY7C148-35C CY7C148-25C+ ATPA 7130SA100P 24l01 7C263/4-35C 7164S15Y cy9122-25 7133SA35J 7142sa55 7130sa55p cy2149-45c PDF

    CY62256LL-PC

    Abstract: VIC068A-GC VIC64-NC VIC64-UMB PALCE22V10-JI PALC16L8Q PLD VME A113 CY7B923 JESD22-A113
    Text: Cypress Semiconductor Product Reliability 1997 Published June, 1997 CYPRESS SEMICONDUCTOR PRODUCT RELIABILITY TABLE OF CONTENTS 1.0 OVERVIEW OF CYPRESS SEMICONDUCTOR TOTAL QUALITY MANAGEMENT SYSTEM. 1 2.0 ELECTRICAL AVERAGE OUTGOING QUALITY. 2


    Original     		PALCE22V10-JC FLASH-FL22D CY62256LL-PC VIC068A-GC VIC64-NC VIC64-UMB PALCE22V10-JI PALC16L8Q PLD VME A113 CY7B923 JESD22-A113 PDF

    EPM5128LC

    Abstract: IDT CYPRESS CROSS REFERENCE clocks epm5064lc-1 EPM5128LC-1 EPM5064LC EPM5128LC-2 EPM5128GI EPM5128JC-1 8464c 5962-8871309
    Text: Product Line Cross Reference CYPRESS CYPRESS CYPRESS CYPRESS CYPRESS CY2148-35C CY21L48-35C CY7C168A-35C CY7C168A-25C 5962-8871309XX 5962-89839112X CY2148-35C CY7C148-35C CY7C168A-45M CY7C168A-35M+ 5962-8871310RX 5962-8983913RX CY2148-35M CY7C148-35M CY7C169A-35C


    Original     		CY2148-35C CY21L48-35C CY7C168A-35C CY7C168A-25C 5962-8871309XX 5962-89839112X CY7C148-35C CY7C168A-45M CY7C168A-35M+ EPM5128LC IDT CYPRESS CROSS REFERENCE clocks epm5064lc-1 EPM5128LC-1 EPM5064LC EPM5128LC-2 EPM5128GI EPM5128JC-1 8464c 5962-8871309 PDF

    cy7c9101

    Abstract: CY2901 CY7C190 PLD20RA10 CY2149 CY7C122 CY7C148 CY7C149 CY7C150 22V10-Macrocell
    Text: Military Product Selector Guide Static RAMs Size Organization 64 64 1K 1K 4K 4K 4K 4K 4K 8K 8K 16K 16K 16K 16K 16K 16K 16K 16K 16K 32K 32K 32K 32K 32K 64K 64K 64K 64K 64K 64K 64K 64K 64K 64K 64K 64K 64K 64K 64K 64K 256K 256K 256K 256K 256K 256K 256K 1M 1M


    Original     		MILSTD883D 22pin 24pin 28pin 32pin 300mil cy7c9101 CY2901 CY7C190 PLD20RA10 CY2149 CY7C122 CY7C148 CY7C149 CY7C150 22V10-Macrocell PDF

    Untitled

    Abstract: No abstract text available
    Text: REVISIONS LTR DESCRIPTION A DATE YR-MO-DA Update drawing to reflect current requirements - glg. 13-02-07 APPROVED Charles Saffle REV SHEET REV SHEET REV STATUS REV A A A A A A A A A A A A A OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 12 13 PMIC N/A STANDARD


    Original     		PDF

    CY27S03A

    Abstract: 15JC10 CY7C190 cy7c9101 cy7c122 die VIC068A user guide
    Text: Thermal Management and Component Reliability slope of the logarithmic plots is given by the activation energy of the failure mechanisms causing thermally activated wear out of the device see Figure 1 . One of the key variables determining the long-term reliability


    Original     		CY7C122 CY27S03A 15JC10 CY7C190 cy7c9101 cy7c122 die VIC068A user guide PDF

    CY7C9101

    Abstract: CY7C510 CY7C190 cy7c189 G30-88 CY7c910 EA 9394 cy3341 CY6116 cy7c901
    Text: fax id: 8511 Thermal Management Thermal Management and Component Reliability One of the key variables determining the long-term reliability of an integrated circuit is the junction temperature of the device during operation. Long-term reliability of the semiconductor chip degrades proportionally with increasing temperatures following an exponential function described by the


    Original     		PDF

    Gunn Diode symbol

    Abstract: cy202 CY7C190 WSP-109BMP3 pal22V10D cy7b166 cy7c291 CY7C371 EV film cap calculation gunn diode datasheet
    Text: CYPRESS SEMICONDUCTOR PRODUCT RELIABILITY APPENDIX A: FAILURE RATE CALCULATION Thermal Acceleration Factors Acceleration factors AF for thermal stresses (High Temperature Operating Life, Data Retention and High Temperature Steady State Life) are calculated from the Arrhenius equation.


    Original     		62x10-5 Gunn Diode symbol cy202 CY7C190 WSP-109BMP3 pal22V10D cy7b166 cy7c291 CY7C371 EV film cap calculation gunn diode datasheet PDF

    multi 9 ihp 2c

    Abstract: 300-mil
    Text: • Capable o f w ithstanding >2001V static discharge Features • CMOS for optimum speed/power • Windowed for reprogrammability • High speed — tSA = 45 ns 7C287 — t c o = IS ns (7C287) — tAcc = 50 ns (7C286) • Low power — 120 mA active — 40 mA standby (7C286)


    OCR Scan     		CY7C286 CY7C287 7C287) 7C286) 7C287 300-mil multi 9 ihp 2c PDF