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cy3341 Abstract: 64K X 4 CACHE SRAM CY7C190 pasic380 cy7c189 palce22v10 programming guide palce16v8 programming algorithm STATIC RAM 6264 vhdl code for 8-bit parity checker 64x18 synchronous sram Text: Product Selector Guide Static RAMs Organization/Density Density X1 X4 X4 SIO 7C147 2147 7C123 7C148 7C149 7C150 7C189 7C190 2148 2149 7C122 9122 93422 7C167A 7C168A 7C169A 7C170A 7C171A 7C172A 7C128A 7C187 7C164 7C166 7C161 7C162 7C185 6264 7C182 7C197 7C194	Original	PDF	7C147 7C123 7C148 7C149 7C150 7C189 7C190 7C122 7C167A 7C168A cy3341 64K X 4 CACHE SRAM CY7C190 pasic380 cy7c189 palce22v10 programming guide palce16v8 programming algorithm STATIC RAM 6264 vhdl code for 8-bit parity checker 64x18 synchronous sram
CY27S03A Abstract: 15JC10 CY7C190 cy7c9101 cy7c122 die VIC068A user guide Text: Thermal Management and Component Reliability slope of the logarithmic plots is given by the activation energy of the failure mechanisms causing thermally activated wear out of the device see Figure 1 . One of the key variables determining the long-term reliability	Original	PDF	CY7C122 CY27S03A 15JC10 CY7C190 cy7c9101 cy7c122 die VIC068A user guide
CY7C9101 Abstract: CY7C510 CY7C190 cy7c189 G30-88 CY7c910 EA 9394 cy3341 CY6116 cy7c901 Text: fax id: 8511 Thermal Management Thermal Management and Component Reliability One of the key variables determining the long-term reliability of an integrated circuit is the junction temperature of the device during operation. Long-term reliability of the semiconductor chip degrades proportionally with increasing temperatures following an exponential function described by the	Original	PDF
27lS03 Abstract: CY27S07 74S189 cy7c189 CY27S07ALMB CY27S07PC 27S03 CY74S189 27S07 5189 Text: CY74S189, CY27LS03 CY27S03, CY27S07 W CYPRESS SEMICONDUCTOR Features 16 x 4 Static RAV RAM • Three-state outputs • in c o m p a t ib le interface levels • Fully decoded, 16 word x 4-bit high speed CMOS RAMs • Inverting outputs 27S03,27LS03, 74S189	OCR Scan	PDF	CY74S189, CY27LS03 CY27S03, CY27S07 27S03 27LS03, 74S189 27S07 27LS03) 64-bit 27lS03 CY27S07 74S189 cy7c189 CY27S07ALMB CY27S07PC CY74S189 27S07 5189
S1095 Abstract: CY27S07A Text: CY74S189, CY27LS03 CY27S03, CY27S07 CYPRESS SEMICONDUCTOR • Inverting outputs 27S03, 27LS03, 74S189 • Non-Inverting outputs 27S07 • High speed — 25 ns • Low power — 210 mW 27LS03 • Power supply 5V ± 10% • Advanced high-speed CMOS process	OCR Scan	PDF	27S03, 27LS03, 74S189 27S07 27LS03) CY74S189, CY27LS03 CY27S03, CY27S07 74S189PC S1095 CY27S07A
cy27s07almb Abstract: CY27S07PC 27ls03 74S189 7C189 cy74s189 Text: CY74S189, CY27LS03 CY27S03, CY27S07 CYPRESS SEMICONDUCTOR Features • Fully decoded, 16 word x 4-bit high speed CMOS RAMs • Inverting outputs 27S03, 27LS03, 74S189 • Non-inverting outputs 27S07 • High speed — 25 ns • Low power - 210 mW 27LS03	OCR Scan	PDF	27S03, 27LS03, 74S189 27S07 27LS03) CY74S189, CY27LS03 CY27S03, CY27S07 CY74S189PC cy27s07almb CY27S07PC 27ls03 74S189 7C189 cy74s189
27S03 Abstract: CY27S07ALMB cy74s189 CY27S07PC 27lS03 64-bit 16x4 ram with inverting three-state 54RM Text: CY74S189, CY27LS03 CY27S03, CY27S07 CYPRESS SEMICONDUCTOR ^ 16 x 4 Static RAV RAM Features • Three-state outputs • Fully decoded, 16 word x 4-bit high speed CM OS RAMs • TTL-compatible interface levels • Inverting outputs 27S03,27L S03, 74S189 These devices are high-performance	OCR Scan	PDF	CY74S189, CY27LS03 CY27S03, CY27S07 CY27S07) CY74S189PC CY74S189DC CY27LS03LMB CY27LS03DMB 38-00041-C 27S03 CY27S07ALMB cy74s189 CY27S07PC 27lS03 64-bit 16x4 ram with inverting three-state 54RM