CY7C268 Search Results

Contextual Info: CY7C268 CY7C269 CYPRESS SEMICONDUCTOR 64K Registered Diagnostic PROM Features Functional Description • C M O S for op tim u m sp eed /p ow er • High speed T h e CY7C268 and the CY7C269 are 64K registered diagnostic PR O M s. T hey are b o th organized as 8,192 words by 8 bits

Contextual Info: CY7C268 CY7C269 p y p p p rc c 64K Registered Diagnostic PROM SEMICONDUCTOR Features Functional Description • C M O S for optimum speed/ power T he CY7C268 an d C Y 7C 269 are 64K R egistered D iagnostic P R O M s. T hey are both organized 8192 w ords by 8

C2681

Abstract: CY7C269 3d0c 7C268-5
Contextual Info: CY7C268 CY7C269 CYPRESS SEMICONDUCTOR 8192 x 8 Registered Diagnostic PROM Features Functional Description • C M O S fo r optim um speed/pow er T h e CY 7C268 an d th e CY 7C269 are 8192 x 8 reg istered diagnostic PR O M s. They a re both o rg an ized as 8,192 w ords by 8 bits

AU- 3JS

Abstract: C2682 333Q CY7C269 7c269 7C268 7C269-IS
Contextual Info: HbE D H E ä ö ^ b b S OOObflQÖ □ Q C Y P CY7C268 CY7C269 CYPRESS SEMICONDUCTOR 8192 x 8 Registered Diagnostic PROM Features Functional Description • CMOS for optimum speed/power • Highspeed — 15-ns max set-up —•12-ns clock to output • Low power

CH AJ 11P

Contextual Info: CY7C268 CY7C269 CYPRESS SEMICONDUCTOR F eatures F unctional D escription • CM O S for optim um speed/pow er T he CY7C268 and the CY 7C269 are 8192 x 8 registered diagnostic PR O M s. They are both organized as 8,192 w ords by 8 bits wide, and they have b o th a pipeline output

Contextual Info: CY7C268 CY7C269 CYPRESS SEMICONDUCTOR 8192 x 8 Registered Diagnostic PROM Features Functional Description • C M O S fo r optim um speed/pow er T h e CY 7C268 an d th e CY 7C269 are 8192 x 8 reg istered diagnostic PR O M s. They a re both o rg an ized as 8,192 w ords by 8 bits

CY27S03A

Abstract: 15JC10 CY7C190 cy7c9101 cy7c122 die VIC068A user guide
Contextual Info: Thermal Management and Component Reliability slope of the logarithmic plots is given by the activation energy of the failure mechanisms causing thermally activated wear out of the device see Figure 1 . One of the key variables determining the long-term reliability

Contextual Info: PROM Programming Information SEMICONDUCTOR Introduction w ith th e c o n tro l gate. T h e sta te o f th e floating gate, c h arg ed o r u n c h arg ed , is p e rm a n e n t because th e gate is isolated in an ex trem ely p u re oxide. T h e c h arg e m ay be

CY7C169

Abstract: 54600
Contextual Info: Thermal Management CYPRESS Part Number CY7B173 CY7B174 CY7B180 CY7B181 CY7B185 CY7B186 CY7B191 CY7B192 CY7B194 CY7C122 CY7C123 CY7C128 CY7C128A CY7C130 CY7C131 CY7C132 CY7C136 CY7C140 CY7C141 CY7C142 CY7C146 CY7C147 CY7C148 CY7C149 CY7C150 CY7C157 CY7C161A

CY7C269

Contextual Info: CYPRESS SEMI CONDUCTOR MOE D 01 2SiHbba 0 DD5 21 Ö, 7 D C Y P T " f& 7 3 -2 r c Y 7 C 2 6 8 CY7C269 CYPRESS SEMICONDUCTOR 64K Registered D iagnostic PROM F eatures F unctional D escrip tion • CMOS for optimum speed/power • High speed — 15-ns max set-up

CY7C9101

Abstract: CY7C510 CY7C190 cy7c189 G30-88 CY7c910 EA 9394 cy3341 CY6116 cy7c901
Contextual Info: fax id: 8511 Thermal Management Thermal Management and Component Reliability One of the key variables determining the long-term reliability of an integrated circuit is the junction temperature of the device during operation. Long-term reliability of the semiconductor chip degrades proportionally with increasing temperatures following an exponential function described by the

27S49

Abstract: ZM2000 CY7C281 CY7C235 27s25 27S49/27S49A-45/27S49A
Contextual Info: CYPRESS SEMICONDUCTOR PROM Programming Information Introduction w ith th e control gate. T he state o f the floating gate, charged o r uncharged, is perm anent because the gate is isolated in an extrem ely pure oxide. T he charge m ay be rem oved if the device is irrad iated w ith ultraviolet energy