SCTA056 Search Results

SCTA056

Abstract: SN74LVT8986
Contextual Info: Application Report SCTA056 - November 2002 Cascading Multiple-Linking Addressable-Scan-Port Devices Rakesh N. Joshi and Kenneth L. Williams MPD Digital Products ABSTRACT This application report is intended to illustrate the capability of cascading multiple Texas

identification trace code texas

Contextual Info: SN54ACT8997, SN74ACT8997 SCAN-PATH LINKERS WITH 4-BIT IDENTIFICATION BUSES SCAN-CONTROLLED IEEE STD 1149.1 JTAG TAP CONCATENATORS SCAS157D – APRIL 1990 – REVISED DECEMBER 1996 D D D D D D D D D Members of the Texas Instruments SCOPE  Family of Testability Products

Contextual Info: SN54ABTH18502A, SN54ABTH182502A, SN74ABTH18502A, SN74ABTH182502A SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS SCBS164E – AUGUST 1993 – REVISED DECEMBER 1996 D D D D D D D D Members of the Texas Instruments SCOPE  Family of Testability Products

bct8240a

Contextual Info: SN54BCT8240A, SN74BCT8240A SCAN TEST DEVICES WITH OCTAL INVERTING BUFFERS SCBS067E – FEBRUARY 1990 – REVISED DECEMBER 1996 D D D D D description The ’BCT8240A scan test devices with octal buffers are members of the Texas Instruments SCOPE testability integrated-circuit family. This

Contextual Info: SN54ABT8996, SN74ABT8996 10-BIT ADDRESSABLE SCAN PORTS MULTIDROP-ADDRESSABLE IEEE STD 1149.1 JTAG TAP TRANSCEIVERS SCBS489C – AUGUST 1994 – REVISED APRIL 1999 D D D D D D D D 1 24 2 23 3 22 4 21 5 20 6 19 7 18 8 17 9 16 10 15 11 14 12 13 A5 A6 A7 A8

Contextual Info: SN74LVT8980AĆEP EMBEDDED TESTĆBUS CONTROLLER IEEE STD 1149.1 JTAG TAP MASTERS WITH 8ĆBIT GENERIC HOST INTERFACES SCBS761A − JUNE 2003 − REVISED OCTOBER 2003 D Controlled Baseline D D D D D D D D D D Flexible TCK Generator Provides − One Assembly/Test Site, One Fabrication

ABT8996

Contextual Info: SN74LVT8996ĆEP 3.3ĆV 10ĆBIT ADDRESSABLE SCAN PORT MULTIDROPĆADDRESSABLE IEEE STD 1149.1 JTAG TAP TRANSCEIVER SCBS764 − SEPTEMBER 2003 D Controlled Baseline D D D D D D D D D D D Simple Addressing (Shadow) Protocol Is − One Assembly/Test Site, One Fabrication

tms 1035

Contextual Info: SN54ABT18245A, SN74ABT18245A SCAN TEST DEVICES WITH 18-BIT BUS TRANSCEIVERS SCBS110H – AUGUST 1992 – REVISED FEBRUARY 1999 D D D D D D Members of the Texas Instruments SCOPE  Family of Testability Products Members of the Texas Instruments Widebus Family