Untitled
Abstract: No abstract text available
Text: Reliability Test TEST ITEM 1.TEMPERATURE CYCLE TC 2. HIGH TEMP. STORAGE (HTS) 3.LOW TEMP. STORAGE (LTS) 4.MOISTURE RESISTANCE (MR) 5.PRESSURE COOKER TEST (PCT) 6.SOLDERABILITY TEST (ST) TEST METHOD MIL-STD (1)MIL-STD-883D 1010.C0ND.C (2)JIS C7021 A-4 (1)MIL-STD-750B1031
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MIL-STD-883D
C7021
MIL-STD-750B1031
MIL-STD-750B1021
C7021B-11-C
EIAJ-IC-121
MIL-STD-883D2003
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sd667
Abstract: SE621 FDX1125B SDX1155 SDX1155B UL-94-VO IEC-68-2-20 TA-NWT-000983 se6303 SE6211
Text: Interim Qualification Report 2000 Hours Endurance Reliability Data SDX1155B, FDX1125B Summary This report summarizes the Qualification testing of both the SDX1155B and FDX1125B over a range of environmental and mechanical extremes as set out in Bellcore TA-NWT-000983. All
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SDX1155B,
FDX1125B
SDX1155B
FDX1125B
TA-NWT-000983.
int06
SD668107
SD668110
sd667
SE621
SDX1155
UL-94-VO
IEC-68-2-20
TA-NWT-000983
se6303
SE6211
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TA-NWT-000983
Abstract: No abstract text available
Text: Qualification Report Reliability Data XMT5x70x-155 XMT5170B-622 XMT5370x-622 Summary The XMT5x70x-155, XMT5170B-622 and XMT5370x-622 transmitter modules have been successfully qualified in accordance with the requirements of Bellcore Document TA-NWT-000983 under
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XMT5x70x-155
XMT5170B-622
XMT5370x-622
XMT5x70x-155,
TA-NWT-000983
XMT5170A-155
TA-NWT-000983.
DePTK295509
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Ablebond 71-1
Abstract: Ablebond pp 42 mos Stag Programmers TMS28F512A TEXAS INSTRUMENTS bytek TMS28F512A The Diode Data Book with Package Outlines 1993 BL1023 "B & C microsystems" Sn 0503
Text: TMS28F512A 512K Flash Memory Technical Brief 1993 MOS Memory Printed in U.S.A., November 1993 SMJA003 Book Type Two Lines Volume # Volume # Book Type Book Type Two Lines Book Type Book Type Title Two Lines Subtitle Line Two Title Two Lines Subtitle Title Two Lines
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TMS28F512A
SMJA003
TMS28F512A
November1993
Ablebond 71-1
Ablebond
pp 42 mos Stag Programmers
TMS28F512A TEXAS INSTRUMENTS
bytek
The Diode Data Book with Package Outlines 1993
BL1023
"B & C microsystems"
Sn 0503
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Untitled
Abstract: No abstract text available
Text: MAX685EEE Rev. A RELIABILITY REPORT FOR MAX685EEE PLASTIC ENCAPSULATED DEVICES November 9, 2001 MAXIM INTEGRATED PRODUCTS 120 SAN GABRIEL DR. SUNNYVALE, CA 94086 Written by Reviewed by Jim Pedicord Quality Assurance Reliability Lab Manager Bryan J. Preeshl
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MAX685EEE
MAX685
100pf
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NSO package
Abstract: PW36 MAX8215
Text: MAX8215xxD Rev. A RELIABILITY REPORT FOR MAX8215xxD PLASTIC ENCAPSULATED DEVICES April 3, 2004 MAXIM INTEGRATED PRODUCTS 120 SAN GABRIEL DR. SUNNYVALE, CA 94086 Written by Reviewed by Jim Pedicord Quality Assurance Reliability Lab Manager Bryan J. Preeshl
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MAX8215xxD
MAX8215
100pf
NSO package
PW36
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gold metal detectors
Abstract: metal detector plans MAX6808 MS22 SC143 Korea aluminum alloy production data
Text: MAX6808xxxx Rev. A RELIABILITY REPORT FOR MAX6808xxxx PLASTIC ENCAPSULATED DEVICES March 8, 2002 MAXIM INTEGRATED PRODUCTS 120 SAN GABRIEL DR. SUNNYVALE, CA 94086 Written by Reviewed by Jim Pedicord Quality Assurance Reliability Lab Manager Bryan J. Preeshl
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MAX6808xxxx
MAX6808
100pf
gold metal detectors
metal detector plans
MS22
SC143
Korea aluminum alloy production data
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MAX8216
Abstract: PW36 PW36-1
Text: MAX8216xxD Rev. A RELIABILITY REPORT FOR MAX8216xxD PLASTIC ENCAPSULATED DEVICES January 18, 2002 MAXIM INTEGRATED PRODUCTS 120 SAN GABRIEL DR. SUNNYVALE, CA 94086 Written by Reviewed by Jim Pedicord Quality Assurance Reliability Lab Manager Bryan J. Preeshl
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MAX8216xxD
MAX8216
100pf
PW36
PW36-1
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Untitled
Abstract: No abstract text available
Text: MAX825TExK Rev. B RELIABILITY REPORT FOR MAX825TExK PLASTIC ENCAPSULATED DEVICES August 14, 2001 MAXIM INTEGRATED PRODUCTS 120 SAN GABRIEL DR. SUNNYVALE, CA 94086 Written by Reviewed by Jim Pedicord Quality Assurance Reliability Lab Manager Bryan J. Preeshl
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MAX825TExK
MAX825T
100pf
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MAX793
Abstract: MAX793T
Text: MAX793TxxE Rev. A RELIABILITY REPORT FOR MAX793TxxE PLASTIC ENCAPSULATED DEVICES May 29th, 2003 MAXIM INTEGRATED PRODUCTS 120 SAN GABRIEL DR. SUNNYVALE, CA 94086 Written by Reviewed by Jim Pedicord Quality Assurance Reliability Lab Manager Bryan J. Preeshl
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MAX793TxxE
MAX793T
100pf
MAX793
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Untitled
Abstract: No abstract text available
Text: MAX230 Rev. B RELIABILITY REPORT FOR MAX230xxP CERAMIC DEVICES August 16, 2001 MAXIM INTEGRATED PRODUCTS 120 SAN GABRIEL DR. SUNNYVALE, CA 94086 Written by Reviewed by Jim Pedicord Quality Assurance Reliability Lab Manager Bryan J. Preeshl Quality Assurance
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MAX230
MAX230xxP
100pf
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AH-02
Abstract: No abstract text available
Text: MAX4544xxx Rev. A RELIABILITY REPORT FOR MAX4544xxx PLASTIC ENCAPSULATED DEVICES October 10, 2001 MAXIM INTEGRATED PRODUCTS 120 SAN GABRIEL DR. SUNNYVALE, CA 94086 Written by Reviewed by Jim Pedicord Quality Assurance Reliability Lab Manager Bryan J. Preeshl
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MAX4544xxx
MAX4544
100pf
AH-02
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reliability report
Abstract: MAX230
Text: MAX230xxP Rev. B RELIABILITY REPORT FOR MAX230xxP Plastic Encapsulated Devices August 16, 2001 MAXIM INTEGRATED PRODUCTS 120 SAN GABRIEL DR. SUNNYVALE, CA 94086 Written by Reviewed by Jim Pedicord Quality Assurance Reliability Lab Manager Bryan J. Preeshl
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MAX230xxP
MAX230
100pf
reliability report
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Untitled
Abstract: No abstract text available
Text: MAX4372TExx Rev. A RELIABILITY REPORT FOR MAX4372TExx PLASTIC ENCAPSULATED DEVICES December 3, 2001 MAXIM INTEGRATED PRODUCTS 120 SAN GABRIEL DR. SUNNYVALE, CA 94086 Written by Reviewed by Jim Pedicord Quality Assurance Reliability Lab Manager Bryan J. Preeshl
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MAX4372TExx
MAX4372T
100pf
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CM21
Abstract: MAX931
Text: MAX931xxA Rev. A RELIABILITY REPORT FOR MAX931xxA PLASTIC ENCAPSULATED DEVICES July 24, 2003 MAXIM INTEGRATED PRODUCTS 120 SAN GABRIEL DR. SUNNYVALE, CA 94086 Written by Reviewed by Jim Pedicord Quality Assurance Reliability Lab Manager Bryan J. Preeshl Quality Assurance
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MAX931xxA
MAX931
100pf
CM21
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oa47 diode
Abstract: OA47 diode OA47 MAX412
Text: MAX412xxxA Rev. A RELIABILITY REPORT FOR MAX412xxxA PLASTIC ENCAPSULATED DEVICES January 19, 2002 MAXIM INTEGRATED PRODUCTS 120 SAN GABRIEL DR. SUNNYVALE, CA 94086 Written by Reviewed by Jim Pedicord Quality Assurance Reliability Lab Manager Bryan J. Preeshl
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MAX412xxxA
MAX412
100pf
oa47 diode
OA47
diode OA47
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Untitled
Abstract: No abstract text available
Text: MAX3222xxx Rev. A RELIABILITY REPORT FOR MAX3222xxx PLASTIC ENCAPSULATED DEVICES August 21, 2001 MAXIM INTEGRATED PRODUCTS 120 SAN GABRIEL DR. SUNNYVALE, CA 94086 Written by Reviewed by Jim Pedicord Quality Assurance Reliability Lab Manager Bryan J. Preeshl
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MAX3222xxx
MAX3222
100pf
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AH141
Abstract: No abstract text available
Text: MAX4582xxE Rev. B RELIABILITY REPORT FOR MAX4582xxE PLASTIC ENCAPSULATED DEVICES August 6, 2001 MAXIM INTEGRATED PRODUCTS 120 SAN GABRIEL DR. SUNNYVALE, CA 94086 Written by Reviewed by Jim Pedicord Quality Assurance Reliability Lab Manager Bryan J. Preeshl
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MAX4582xxE
MAX4582
100pf
AH141
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MIL-STD-883 Method 3015.7
Abstract: 1501 Dc to Dc converter CM211 CM21-1 MAX971
Text: MAX971xxA Rev. A RELIABILITY REPORT FOR MAX971xxA PLASTIC ENCAPSULATED DEVICES January 30, 2003 MAXIM INTEGRATED PRODUCTS 120 SAN GABRIEL DR. SUNNYVALE, CA 94086 Written by Reviewed by Jim Pedicord Quality Assurance Reliability Lab Manager Bryan J. Preeshl
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MAX971xxA
MAX971
100pf
MIL-STD-883 Method 3015.7
1501 Dc to Dc converter
CM211
CM21-1
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CM21
Abstract: MAX921
Text: MAX921xxA Rev. A RELIABILITY REPORT FOR MAX921xxA PLASTIC ENCAPSULATED DEVICES August 12, 2002 MAXIM INTEGRATED PRODUCTS 120 SAN GABRIEL DR. SUNNYVALE, CA 94086 Written by Reviewed by Jim Pedicord Quality Assurance Reliability Lab Manager Bryan J. Preeshl
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MAX921xxA
MAX921
100pf
CM21
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MAX973
Abstract: No abstract text available
Text: MAX973xxA Rev. A RELIABILITY REPORT FOR MAX973xxA PLASTIC ENCAPSULATED DEVICES July 29, 2002 MAXIM INTEGRATED PRODUCTS 120 SAN GABRIEL DR. SUNNYVALE, CA 94086 Written by Reviewed by Jim Pedicord Quality Assurance Reliability Lab Manager Bryan J. Preeshl Quality Assurance
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MAX973xxA
MAX973
100pf
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cmos 4518
Abstract: No abstract text available
Text: MAX521xxxx Rev. A RELIABILITY REPORT FOR MAX521xxxx PLASTIC ENCAPSULATED DEVICES November 28, 2001 MAXIM INTEGRATED PRODUCTS 120 SAN GABRIEL DR. SUNNYVALE, CA 94086 Written by Reviewed by Jim Pedicord Quality Assurance Reliability Lab Manager Bryan J. Preeshl
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MAX521xxxx
MAX521
100pf
cmos 4518
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SE6211
Abstract: RSE635204 SE630505
Text: ma I H EW L E T T K firn P A C K A R D Interim Qualification Report 2000 Hours Endurance Reliability Data SDX1155B, FDX1125B Summary This report summarizes the Qualification testing of both the SDX1155B and FDX1125B over a range of environmental and mechanical extremes as set out
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SDX1155B,
FDX1125B
SDX1155B
FDX1125B
TA-NWT-000983.
PSD697201
PSD697202
SE6211
RSE635204
SE630505
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SE6211
Abstract: se6303
Text: W hatHEW LETT mL'HM PACKARD Interim Qualification Report 2000 hours Endurance Reliability Data SDX1155B, FDX1125B Summary This report summarizes the Qualification testing of both the SDX1155B and FDX1125B over a range of environmental and mechanical extrem es as set out in
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SDX1155B,
FDX1125B
SDX1155B
TheFDX1125B
SDX1155B.
TA-NWT-000983.
perfo68
SE6211
se6303
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