MAXWELL 79LV0832 Search Results
MAXWELL 79LV0832 Datasheets Context Search
Catalog Datasheet | Type | Document Tags | |
---|---|---|---|
79LV0832Contextual Info: Documentation Change Notice Current Consumption Test Conditions Manufacturer: Manufacturer Product Effected: Document Number: Number Revision: Revision Date: Date Maxwell Technologies 79LV0832 Data Sheet 1004418 1 May 7, 2003 | Maxwell Technologies | 9244 Balboa Avenue, San Diego, CA 92123, United States | |
Original |
79LV0832 600uA. | |
79LV0832Contextual Info: Documentation Change Notice Additional Current Consumption Test Conditions Manufacturer: Manufacturer Product P roduct Effected: Document Number: Number Revision: Revision Date: Date Maxwell Technologies 79LV0832 Rev 6 1004418 2 May 29, 2003 | Maxwell Technologies | 9244 Balboa Avenue, San Diego, CA 92123, United States | |
Original |
79LV0832 600uA. | |
Contextual Info: 79LV0832 8 Megabit 256K x 32-Bit Low Voltage EEPROM MCM DESCRIPTION: • • • • Maxwell Technologies’ 79LV0832 multi-chip module (MCM) memory features a greater than 100 krad (Si) total dose tolerance, dependent upon orbit. Using Maxwell Technologies’ patented radiation-hardened RAD-PAK MCM packaging |
Original |
79LV0832 32-Bit) 32-bit 79LV0832 | |
79LV0832Contextual Info: 79LV0832 8 Megabit 256K x 32-Bit Low Voltage EEPROM MCM DESCRIPTION: • • • • Maxwell Technologies’ 79LV0832 multi-chip module (MCM) memory features a greater than 100 krad (Si) total dose tolerance, dependent upon orbit. Using Maxwell Technologies’ patented radiation-hardened RAD-PAK MCM packaging |
Original |
79LV0832 32-Bit) 32-bit 79LV0832 10rdering | |
79LV0832
Abstract: Maxwell 79lv0832
|
Original |
79LV0832 32-Bit) I/016-23 79LV0832 32-bit Maxwell 79lv0832 | |
79LV0832Contextual Info: 79LV0832 8 Megabit 256K x 32-Bit Low Voltage EEPROM MCM DESCRIPTION: • 256k x 32-bit EEPROM MCM • RAD-PAK radiation-hardened against natural space radiation • Total dose hardness: - >100 krad (Si) - Dependent upon orbit • Excellent Single event effects |
Original |
79LV0832 32-Bit) 32-bit 79LV0832 | |
DIN 1707Contextual Info: 79LV0832 8 Megabit 256K x 32-Bit Low Voltage EEPROM MCM DESCRIPTION: • 256k x 32-bit EEPROM MCM • RAD-PAK radiation-hardened against natural space radiation • Total dose hardness: - >100 krad (Si) - Dependent upon orbit • Excellent Single event effects |
Original |
79LV0832 32-Bit) 32-bit 79LV0832 DIN 1707 | |
79LV0832Contextual Info: 79LV0832 8 Megabit 256K x 32-Bit Low Voltage EEPROM MCM DESCRIPTION: • 256k x 32-bit EEPROM MCM • RAD-PAK radiation-hardened against natural space radiation • Total dose hardness: - >100 krad (Si) - Dependent upon orbit • Excellent Single event effects |
Original |
79LV0832 32-Bit) 32-bit 79LV0832 | |
Contextual Info: 79LV0832 8 Megabit 256K x 32-Bit Low Voltage EEPROM MCM DESCRIPTION: • 256k x 32-bit EEPROM MCM • RAD-PAK radiation-hardened against natural space radiation • Total dose hardness: - >100 krad (Si) - Dependent upon orbit • Excellent Single event effects @ 25°C |
Original |
79LV0832 32-Bit) 32-bit 79LV0832 | |
79LV0832
Abstract: 79LV radiation hardened cpu
|
Original |
79LV0832 32-Bit) 32-bit 79LV0832 79LV radiation hardened cpu | |
Contextual Info: 79LV0832 8 Megabit 256K x 32-Bit Low Voltage EEPROM MCM DESCRIPTION: • 256k x 32-bit EEPROM MCM • RAD-PAK radiation-hardened against natural space radiation • Total dose hardness: - >100 krad (Si) - Dependent upon orbit • Excellent Single event effects |
Original |
32-Bit) 79LV0832 32-bit 79LV0832 | |
28C011
Abstract: 28LV010 28C010 Maxwell Technologies 79C0832 79LV0408 79LV0832 HN58C1001 1mb eeprom
|
Original |
HN58C1001 28C010 28C011 79C0408 79C0832 28LV010 28LV011 79LV0408 79LV0832 28C011 28LV010 28C010 Maxwell Technologies 79C0832 79LV0408 79LV0832 HN58C1001 1mb eeprom | |
ADC hard radiation
Abstract: 28/ADC hard radiation EEPROM 16MB SCS750 HSN-3000 79LV2040 29F0408 rad-pak 358 9240LP XP-40
|
Original |
MIL-PRF-38535 ISO9001 AS9100 ADC hard radiation 28/ADC hard radiation EEPROM 16MB SCS750 HSN-3000 79LV2040 29F0408 rad-pak 358 9240LP XP-40 |