79LV Search Results

79LV0832

Contextual Info: 79LV0832 8 Megabit 256K x 32-Bit Low Voltage EEPROM MCM DESCRIPTION: • 256k x 32-bit EEPROM MCM • RAD-PAK radiation-hardened against natural space radiation • Total dose hardness: - >100 krad (Si) - Dependent upon orbit • Excellent Single event effects

Contextual Info: SPACE ELECTRONICS INC. 8 MEGABIT EEPROM MCM GND I/O15 ADDR07 GND ADDR06 5V ADDR05 ADDR04 ADDR03 ADDR02 ADDR01 79LV0832RP ADDR00 GND 5V GND GND GND GND 5V GND GND GND GND I/O16 SPACE PRODUCTS 73 CE1 I/O17 I/O14 1 I/O18 I/O13 I/O19 I/O12 I/O20 I/O11 I/O21 I/O10

Contextual Info: 79LV0832 8 Megabit 256K x 32-Bit Low Voltage EEPROM MCM DESCRIPTION: • • • • Maxwell Technologies’ 79LV0832 multi-chip module (MCM) memory features a greater than 100 krad (Si) total dose tolerance, dependent upon orbit. Using Maxwell Technologies’ patented radiation-hardened RAD-PAK MCM packaging

79LV2040

Abstract: 79C0832
Contextual Info: 79LV2040 20 Megabit 512K x 40-Bit Low Low Voltage EEPROM MCM FEATURES: DESCRIPTION: • • • • Maxwell Technologies’ 79LV2040 multi-chip module (MCM) memory features a greater than 100 krad (Si) total dose tolerance, dependent upon orbit. Using Maxwell Technologies’ patented radiation-hardened RAD-PAK MCM packaging

79LV2040

Abstract: 79LV2040B
Contextual Info: 79LV2040B 20 Megabit 512K x 40-Bit Low Low Voltage EEPROM MCM Logic Diagram DESCRIPTION: • 512k x 40-bit EEPROM MCM • RAD-PAK radiation-hardened against natural space radiation • Total dose hardness: - >100 krad (Si) - Dependent upon orbit • Excellent Single event effects @ 25°C

79LV0408

Contextual Info: 79LV0408 Low Voltage 4 Megabit 512k x 8-bit EEPROM CE1 CE2 CE3 CE4 RES R/B WE OE A0-16 128K x 8 128K x 8 128K x 8 128K x 8 I/O0-7 Logic Diagram Memory FEATURES: DESCRIPTION: • Four 128k x 8-bit EEPROMs MCM • RAD-PAK radiation-hardened against natural

79LV0832

Contextual Info: Documentation Change Notice Current Consumption Test Conditions Manufacturer: Manufacturer Product Effected: Document Number: Number Revision: Revision Date: Date Maxwell Technologies 79LV0832 Data Sheet 1004418 1 May 7, 2003 | Maxwell Technologies | 9244 Balboa Avenue, San Diego, CA 92123, United States |

Contextual Info: 79LV0408 Low Voltage 4 Megabit 512k x 8-bit EEPROM CE1 CE2 CE3 CE4 RES R/B WE OE A0-16 128K x 8 128K x 8 128K x 8 128K x 8 I/O0-7 Logic Diagram Memory FEATURES: DESCRIPTION: • Four 128k x 8-bit EEPROMs MCM • RAD-PAK radiation-hardened against natural

79LV2040

Contextual Info: 79LV2040 20 Megabit 512K x 40-Bit Low Low Voltage EEPROM MCM FEATURES: DESCRIPTION: • • • • Maxwell Technologies’ 79LV2040 multi-chip module (MCM) memory features a greater than 100 krad (Si) total dose tolerance, dependent upon orbit. Using Maxwell Technologies’ patented radiation-hardened RAD-PAK MCM packaging

79LV0832

Abstract: Maxwell 79lv0832
Contextual Info: 79LV0832 Low Voltage 8 Megabit 256K x 32-Bit EEPROM MCM CE1 128K x 8 128K x 8 128K x 8 128K x 8 128K x 8 128K x 8 128K x 8 128K x 8 ADD CNTL CE2 I/O0-7 I/O8-15 I/016-23 I/O24-31 Memory Logic Diagram FEATURES: DESCRIPTION: • • • • Maxwell Technologies’ 79LV0832 multi-chip module (MCM)

79LV2040

Contextual Info: 79LV2040 20 Megabit 512K x 40-Bit Low Low Voltage EEPROM MCM FEATURES: DESCRIPTION: • • • • Maxwell Technologies’ 79LV2040 multi-chip module (MCM) memory features a greater than 100 krad (Si) total dose tolerance, dependent upon orbit. Using Maxwell Technologies’ patented radiation-hardened RAD-PAK MCM packaging

79LV0832

Contextual Info: 79LV0832 8 Megabit 256K x 32-Bit Low Voltage EEPROM MCM DESCRIPTION: • 256k x 32-bit EEPROM MCM • RAD-PAK radiation-hardened against natural space radiation • Total dose hardness: - >100 krad (Si) - Dependent upon orbit • Excellent Single event effects

transistor comparison data sheet

Abstract: Maxwell 79lv0408 all data sheet Maxwell 79LV0408
Contextual Info: 79LV0408 Low Voltage 4 Megabit 512k x 8-bit EEPROM MCM Vcc CE1 CE2 Vss RDY/BUSY A16 A14 A12 A7 A6 A5 A4 A3 A2 A1 A0 I/O0 I/O1 I/O2 Vss 40 1 79LV0408 20 21 Vcc CE3 CE4 Vss A15 RES WE A13 A8 A9 A11 OE A10 Vcc I/O7 I/O6 I/O5 I/O4 I/O3 Vss CE2 CE1 CE3 CE4 RES

79LV0832

Contextual Info: 79LV0832 8 Megabit 256K x 32-Bit Low Voltage EEPROM MCM DESCRIPTION: • • • • Maxwell Technologies’ 79LV0832 multi-chip module (MCM) memory features a greater than 100 krad (Si) total dose tolerance, dependent upon orbit. Using Maxwell Technologies’ patented radiation-hardened RAD-PAK MCM packaging

Contextual Info: 79LV0408 Low Voltage 4 Megabit 512k x 8-bit EEPROM CE1 CE2 CE3 CE4 RES R/B WE OE A0-16 128K x 8 128K x 8 128K x 8 I/O0-7 • • • Four 128k x 8-bit EEPROMs MCM • RAD-PAK radiation-hardened against natural space radiation • Total dose hardness: - > 100 krad (Si), depending upon space mission

79LV0832

Contextual Info: Documentation Change Notice Additional Current Consumption Test Conditions Manufacturer: Manufacturer Product P roduct Effected: Document Number: Number Revision: Revision Date: Date Maxwell Technologies 79LV0832 Rev 6 1004418 2 May 29, 2003 | Maxwell Technologies | 9244 Balboa Avenue, San Diego, CA 92123, United States |

Contextual Info: 79LV0408 Low Voltage 4 Megabit 512k x 8-bit EEPROM CE1 CE2 CE3 CE4 RES R/B WE OE A0-16 128K x 8 128K x 8 128K x 8 128K x 8 I/O0-7 Logic Diagram Memory FEATURES: DESCRIPTION: • Four 128k x 8-bit EEPROMs MCM • RAD-PAK radiation-hardened against natural

79LV0832

Abstract: 79LV radiation hardened cpu
Contextual Info: 79LV0832 8 Megabit 256K x 32-Bit Low Voltage EEPROM MCM DESCRIPTION: • 256k x 32-bit EEPROM MCM • RAD-PAK radiation-hardened against natural space radiation • Total dose hardness: - >100 krad (Si) - Dependent upon orbit • Excellent Single event effects

79LV0408

Abstract: Maxwell 79lv0408
Contextual Info: 79LV0408 Low Voltage 4 Megabit 512k x 8-bit EEPROM CE1 CE2 CE3 CE4 RES R/B WE OE A0-16 128K x 8 128K x 8 128K x 8 128K x 8 I/O0-7 Logic Diagram Memory FEATURES: DESCRIPTION: • Four 128k x 8-bit EEPROMs MCM • RAD-PAK radiation-hardened against natural

Contextual Info: 79LV0832 8 Megabit 256K x 32-Bit Low Voltage EEPROM MCM DESCRIPTION: • 256k x 32-bit EEPROM MCM • RAD-PAK radiation-hardened against natural space radiation • Total dose hardness: - >100 krad (Si) - Dependent upon orbit • Excellent Single event effects @ 25°C

Contextual Info: 79LV0832 8 Megabit 256K x 32-Bit Low Voltage EEPROM MCM DESCRIPTION: • 256k x 32-bit EEPROM MCM • RAD-PAK radiation-hardened against natural space radiation • Total dose hardness: - >100 krad (Si) - Dependent upon orbit • Excellent Single event effects

Contextual Info: GM79L00 Series 100mA NEGATIVE VOLTAGE REGULATOR Description Features The GM79L00 series of fixed-voltage monolithic integrated circuit voltage regulators is designed for a wide range of applications. These applications include on-card regulation for elimination of noise and distribution problems

RAD6000

Abstract: NA-GSFC-2005-04 HCN58C1001 EEPROM retention testing EEPROM retention bake screening GSFC SCS750 RAD6000 processor architecture 79LV0408RPFE-20 28C011TRPFS-12
Contextual Info: Review of GSFC NASA Advisory NA-GSFC-2005-04 Part Types: Models: Manufacturer: EEPROM All EEPROM Models Maxwell Technologies Lot Date Codes: All LDC’s Document: 1009322 Revision: Date: 2 March 24, 2006 | Maxwell Technologies | 9244 Balboa Avenue, San Diego, CA 92123, United States |

eeprom programmer schematic diagram

Abstract: eeprom programmer schematic 58C1001 HCN58C1001 maxwell diagram 79LV0408 Maxwell Maxwell board balboa 1
Contextual Info: Application Note Programming the 4 Megabit EEPROM Part Type: Manufacturer: Document No. : Revision : Date : 79C0408 Maxwell Technologies 1005303 2 Sept. 15, 2003 | Maxwell Technologies | 9244 Balboa Avenue, San Diego, CA 92123, United States | | Phone: +1-858-503-3300 | Fax: +1-858-503-3301 | Web: www.maxwell.com |