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    JIS-C-7022

    Abstract: 2-1-16EIAJAB-6201 ic 353 JIS-C-7032 OKI g3 gs lead free EIAJ ED-4701 305 6201 xr MOS1-4-14 CCD MTBF JIS-C-7021
    Text: J2S0001-27-Y4 作成：1998年 1月 前回作成：1996年 10月 まえがき 平素は沖半導体製品を御愛顧いただき、厚く御礼申し上げます。 急速な発展を遂げているエレクトロニクス産業におきまして、半導体製品の応用


    Original     		PDF J2S0001-27-Y4 J2S0002-27-Y3 J2S0003-27-Y3 ISO9002 Z81151981 GL-31 GL-32 JIS-C-7022 2-1-16EIAJAB-6201 ic 353 JIS-C-7032 OKI g3 gs lead free EIAJ ED-4701 305 6201 xr MOS1-4-14 CCD MTBF JIS-C-7021

    tlp508

    Abstract: JIS-C-5020 JIS C7021 B10 TLP645 JIS-C-5003 JISC5700 TLP573 TLP546G SCR 7704
    Text: 9. Reliability 9.1 General In recent years, as the application fields for photo couplers expand, more discussions are being made on reliability. For reliability improvement, it is insufficient to perform strinct process management and to have reliability tests such as life test and environmental tests. It is necessary to


    OCR Scan     		PDF MIL-STD-883B L-STD-883B MIL-STD-883B tlp508 JIS-C-5020 JIS C7021 B10 TLP645 JIS-C-5003 JISC5700 TLP573 TLP546G SCR 7704