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    Abstract: No abstract text available
    Text: 03/12/2004 RELIABILITY REPORT FOR DS1961S Dallas Semiconductor 4401 South Beltwood Parkway Dallas, TX 75244-3292 Prepared by: Ken Wendel Reliability Engineering Manager Dallas Semiconductor 4401 South Beltwood Pkwy. Dallas, TX 75244-3292 Email : ken.wendel@dalsemi.com


    Original
    PDF DS1961S

    FP4527

    Abstract: 200G DS1963S Hysol
    Text: 03/11/2003 RELIABILITY REPORT FOR DS1963S Dallas Semiconductor 4401 South Beltwood Parkway Dallas, TX 75244-3292 Prepared by: Ken Wendel Reliability Engineering Manager Dallas Semiconductor 4401 South Beltwood Pkwy. Dallas, TX 75244-3292 Email : ken.wendel@dalsemi.com


    Original
    PDF DS1963S FP4527 200G DS1963S Hysol

    FP4527

    Abstract: FP4323 Hysol Dexter IEC-1000-4-2 Maxim ic date code DS1961S FP452 FR 525
    Text: 03/12/2004 RELIABILITY REPORT FOR DS1961S Dallas Semiconductor 4401 South Beltwood Parkway Dallas, TX 75244-3292 Prepared by: Ken Wendel Reliability Engineering Manager Dallas Semiconductor 4401 South Beltwood Pkwy. Dallas, TX 75244-3292 Email : ken.wendel@dalsemi.com


    Original
    PDF DS1961S FP4527 FP4323 Hysol Dexter IEC-1000-4-2 Maxim ic date code DS1961S FP452 FR 525