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Catalog Datasheet	MFG & Type	PDF	Document Tags
MA31750 processor architecture Abstract: 00E-12 mmu ericsson 29C516E ANM052 80C32 80C32E MA31750 65656E 80C32 Harris Semiconductor Text: ANM052 MATRA MHS Radiation Tolerant SRAM for SPACE Applications Introduction The purpose of this document is to analyse the selection criteria for memory chips to be used in Spacecraft computers. A general trend is to implement more autonomous functions in Spacecraft, making use of increased	Original	PDF	ANM052 HRX/93 HM-65656E 00E-06 00E-07 00E-08 00E-09 00E-10 00E-11 00E-12 MA31750 processor architecture 00E-12 mmu ericsson 29C516E ANM052 80C32 80C32E MA31750 65656E 80C32 Harris Semiconductor
temic 80C32 Abstract: mmu ericsson MA31750 processor architecture MA31750 80C32 Harris Semiconductor IDT39C60 65656F 29C516E microcontroller radiation hard 80C32E Text: ANM052 Radiation Tolerant SRAM for SPACE Applications Introduction The purpose of this document is to analyze the selection criteria for memory chips to be used in Spacecraft computers. A general trend is to implement more autonomous functions in Spacecraft, making use of increased	Original	PDF	ANM052 IDT49C460 IDT39C60 AN-24, 32kx8 HM-65664E M-65656F HRX/93 temic 80C32 mmu ericsson MA31750 processor architecture MA31750 80C32 Harris Semiconductor 65656F 29C516E microcontroller radiation hard 80C32E
u1d diode Abstract: MD10 MD11 MD14 29C516E Text: 29C516E 16–Bit Flow–Through EDAC Error Detection And Correction unit 1. Introduction The 29C516E TEMIC EDAC is a very low power flow–through 16–bit Error Detection And Correction unit EDAC with two user data buses. The EDAC is used in a high integrity system for monitoring and correction of	Original	PDF	29C516E 29C516E EDAC16 MQFPF100 MQFPL100 u1d diode MD10 MD11 MD14
atmel edac Abstract: 29C516E MD10 MD11 MD14 Text: 29C516E 16–Bit Flow–Through EDAC Error Detection And Correction unit 1. Introduction The 29C516E Atmel EDAC is a very low power flow–through 16–bit Error Detection And Correction unit EDAC with two user data buses. The EDAC is used in a high integrity system for monitoring and correction of	Original	PDF	29C516E 29C516E EDAC16 MQFPF100 MQFPL100 atmel edac MD10 MD11 MD14
29C516E Abstract: MD10 MD11 MD14 N2227 Text: 29C516E 16–Bit Flow–Through EDAC Error Detection And Correction unit 1. Introduction The 29C516E TEMIC EDAC is a very low power flow–through 16–bit Error Detection And Correction unit EDAC with two user data buses. The EDAC is used in a high integrity system for monitoring and correction of	Original	PDF	29C516E 29C516E EDAC16 MQFPF100 MQFPL100 MD10 MD11 MD14 N2227
MA31750 processor architecture Abstract: atmel 80C32 atmel edac atmel 2816 memory mmu ericsson MA31750 6T SRAM a8961 microcontroller radiation hard SMKS-29C516E Text: ANM052 Radiation Tolerant SRAM for SPACE Applications Introduction The purpose of this document is to analyze the selection criteria for memory chips to be used in Spacecraft computers. A general trend is to implement more autonomous functions in Spacecraft, making use of increased	Original	PDF	ANM052 IDT49C460 IDT39C60 AN-24, 32kx8 HM-65664E M-65656F HRX/93 MA31750 processor architecture atmel 80C32 atmel edac atmel 2816 memory mmu ericsson MA31750 6T SRAM a8961 microcontroller radiation hard SMKS-29C516E
MD812 Abstract: 29C516E MD10 MD11 MD14 20 pin edac Text: 29C516E MATRA MHS 16-Bit Flow-Through EDAC Error Detection And Correction unit Description The 29C516E MHS EDAC is a very low power flow-through 16-bit Error Detection And Correction unit EDAC with two user data buses. The EDAC is used in a high integrity system for monitoring and	Original	PDF	29C516E 16-Bit 29C516E MQFPF100 MQFPL100 MD812 MD10 MD11 MD14 20 pin edac