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Catalog Datasheet	MFG & Type	PDF	Document Tags
Untitled Abstract: No abstract text available Text: E4237/E4257/E4287 Dual Channel Per-Pin Parametric Measurement Unit TEST AND MEASUREMENT PRODUCTS Description The E42X7 is designed to be a low power, low cost, small footprint solution to allow high pin count testers to support a PMU per-pin. E42X7 is a family of Dual Channel Parametric Measurement Units PMU designed for automated test equipment and instrumentation. Manufactured in a wide voltage Bi-CMOS process, it is a monolithic solution for a	Original	PDF	E4237/E4257/E4287 E42X7 E4287 E4257 E4237 25VI/O
Untitled Abstract: No abstract text available Text: E4237/E4257/E4287 Dual Channel Per-Pin Parametric Measurement Unit TEST AND MEASUREMENT PRODUCTS Description PRELIMINARY termination voltages for DUTs with open element outputs. E42X7 is a family of Dual Channel Parametric Measurement Units PMU designed for automated test equipment and instrumentation. Manufactured in a wide voltage Bi-CMOS process, it is a monolithic solution for a	Original	PDF	E4237/E4257/E4287 E42X7 E4287 E4257 E4237 25VI/O E4287AHF
lpcc 9X9 Abstract: LPCC 9x9 32 Sicc 1N5820 E4237 E4237ALP E4257 E4257ALP E4287 E4287AHF Text: E4237/E4257/E4287 Dual Channel Per-Pin Parametric Measurement Unit TEST AND MEASUREMENT PRODUCTS Description The E42X7 is designed to be a low power, low cost, small footprint solution to allow high pin count testers to support a PMU per-pin. E42X7 is a family of Dual Channel Parametric Measurement Units PMU designed for automated test equipment and instrumentation. Manufactured in a wide voltage Bi-CMOS process, it is a monolithic solution for a	Original	PDF	E4237/E4257/E4287 E42X7 E4287, E4257) E4237) E4287AHFT EVM4287AHFT Edge4287 lpcc 9X9 LPCC 9x9 32 Sicc 1N5820 E4237 E4237ALP E4257 E4257ALP E4287 E4287AHF
Edge6435 Abstract: TO3D12 Text: Edge6435/6436 Per-Pin Electronics Companion DAC TEST AND MEASUREMENT PRODUCTS Description The Edge6435/6436 is a low-cost, 40-channel, monolithic ATE level DAC solution manufactured in a wide-voltage bi-CMOS process. The Edge6435/6436 features 2 ranks of input latches	Original	PDF	Edge6435/6436 Edge6435/6436 40-channel, E6435BHFT EVM6435 Edge6435 TO3D12
Untitled Abstract: No abstract text available Text: Edge6435/6436 Per-Pin Electronics Companion DAC TEST AND MEASUREMENT PRODUCTS Description The Edge6435/6436 is a low-cost, 40-channel, monolithic ATE level DAC solution manufactured in a wide-voltage bi-CMOS process. The Edge6435/6436 features 2 ranks of input latches	Original	PDF	Edge6435/6436 Edge6435/6436 40-channel, 13-bit 11-bit E6436) 10-bit E6435)
7812K Abstract: No abstract text available Text: Edge6435/6436 Per-Pin Electronics Companion DAC TEST AND MEASUREMENT PRODUCTS Description The Edge6435/6436 is a low-cost, 40-channel, monolithic ATE level DAC solution manufactured in a wide-voltage bi-CMOS process. The Edge6435/6436 features 2 ranks of input latches	Original	PDF	Edge6435/6436 Edge6435/6436 40-channel, 13-bit 11-bit E6436) 10-bit E6435) E6436BHFT 7812K
01SR1 Abstract: TO3D12 Text: Edge6435/6436 Per-Pin Electronics Companion DAC TEST AND MEASUREMENT PRODUCTS Description The Edge6435/6436 is a low-cost, 40-channel, monolithic ATE level DAC solution manufactured in a wide-voltage bi-CMOS process. The Edge6435/6436 features 2 ranks of input latches	Original	PDF	Edge6435/6436 Edge6435/6436 40-channel, E6435BHF EVM6435 Edge6435 01SR1 TO3D12