DS011570 Search Results

SCANPSC110F

Abstract: SCANPSC110FDMQB SCANPSC110FFMQB SCANPSC110FLMQB SCANPSC110FSC SCANPSC110FSCX
Contextual Info: General Description Features The SCANPSC110F Bridge extends the IEEE Std. 1149.1 test bus into a multidrop test bus environment. The advantage of a hierarchical approach over a single serial scan chain is improved test throughput and the ability to remove a

SCANPSC110FFMQB

Abstract: PSC11 SCANPSC110F SCANPSC110FDMQB SCANPSC110FLMQB SCANPSC110FSC SCANPSC110FSCX
Contextual Info: + / March 1998 P A IF ?C H II_ D SEMICONDUCTOR i SCANPSC110F SCAN Bridge Hierarchical and Multidrop Addressable JTAG Port (IEEE1149.1 System Test Support) General Description Features The SC ANPSC 110F Bridge extends th e IEEE Std. 1149.1 test bus into a m ultidrop test bus environm ent. The advan­

Contextual Info: S E M IC O N D U C T O R tm SCANPSC110F SCAN Bridge Hierarchical and Multidrop Addressable JTAG Port IEEE1149.1 System Test Support General Description Features The SC AN PSC 110F Bridge extends th e IEEE Std. 1149.1 test bus into a m ultidrop test bus environm ent. The advan­

M28B

Abstract: MS-013 SCANPSC110F SCANPSC110FSC
Contextual Info: Revised August 2000 SCANPSC110F SCAN Bridge Hierarchical and Multidrop Addressable JTAG Port IEEE1149.1 System Test Support General Description Features The SCANPSC110F Bridge extends the IEEE Std. 1149.1 test bus into a multidrop test bus environment. The advantage of a hierarchical approach over a single serial scan

16 BIT SHIFT REGISTER

Abstract: PSC11
Contextual Info: I R C H I L D SEMICONDUCTOR tm SCANPSC110F SCAN Bridge Hierarchical and Multidrop Addressable JTAG Port IEEE1149.1 System Test Support General Description Features The SC AN PSC 110F Bridge extends th e IEEE Std. 1149.1 test bus into a m ultidrop te st bus environm ent. The advan­