DMQB INSTEAD OF DM Search Results

74F402

Abstract: "XOR Gates" 54F402DM 54F402FM 54F402LM 74F402PC CRC-16 F402 J16A N16E
Contextual Info: 74F402 Serial Data Polynomial Generator/Checker General Description Features The ’F402 expandable Serial Data Polynomial generator/ checker is an expandable version of the ’F401. It provides an advanced tool for the implementation of the most widely used error detection scheme in serial digital handling systems. A 4-bit control input selects one-of-six generator polynomials. The list of polynomials includes CRC-16,

6ap3

Contextual Info: 54F 74F402 Serial Data Polynomial Generator Checker General Description Features The ’F402 expandable Serial Data Polynomial generator checker is an expandable version of the ’F401 It provides an advanced tool for the implementation of the most widely

54F402DM

Abstract: 54F402FM 54F402LM 74F402 74F402PC CRC-16 F402 J16A N16E
Contextual Info: 54F 74F402 Serial Data Polynomial Generator Checker General Description Features The ’F402 expandable Serial Data Polynomial generator checker is an expandable version of the ’F401 It provides an advanced tool for the implementation of the most widely

Contextual Info: 54F402,74F402 54F402 74F402 Serial Data Polynomial Generator/Checker Literature Number: SNOS196A 54F 74F402 Serial Data Polynomial Generator Checker General Description Features The ’F402 expandable Serial Data Polynomial generator checker is an expandable version of the ’F401 It provides

56th

Abstract: 74F402PC 54F402DM 54F402FM 54F402LM CRC-16 F402 J16A N16E W16A
Contextual Info: January 1995 54F/74F402 Serial Data Polynomial Generator/Checker General Description Features The ’F402 expandable Serial Data Polynom ial g e n e ra to r/ checke r is an expandable version o f th e ’F401. It provides an advanced tool to r th e im plem entation o f th e m ost w idely

LS 7313 - S

Abstract: LS 7313 S
Contextual Info: CM O tß National Semiconductor 54F/74F402 Serial Data Polynomial Generator/Checker General Description Features The 'F 4 0 2 expandable Serial Data Polynom ial g e n e ra to r/ ch ecke r is an e xpandable version of th e ’F4 0 1 . It provides an a dvanced to o l fo r the im plem entation of the m ost w idely

Contextual Info: & January 1995 54F/74F402 Serial Data Polynomial Generator/Checker General Description Features The ’F402 expandable Serial Data Polynom ial g en e ra to r/ ch ecke r is an expandable version o f th e ’F401. It provides an advanced tool fo r th e im plem entation o f th e m ost w idely

IC 3-8 decoder 74138 pin diagram

Abstract: F9444 MSI IC 74138 decoder power control F9444 F9445 self-test 74138 FAIRCHILD f9445 Fairchild 9445 F9445-16DM 74ls240 bus transfer switch
Contextual Info: FAIRCHILD A Schlumberger Company Preliminary Data Sheet April 1982 Description The F9445 is a 16-bit microprocessor implemented using Fairchild’s Isoplanar Integrated Injection Logic l3L technology. This bipolar technology and a sophisticated pipeline architecture combine to give the F9445 very fast

Contextual Info: a l Semiconductor February 1996 SCANPSC110F SCAN Bridge Hierarchical and Multidrop Addressable JTAG Port IEEE 1149.1 System Test Support General Description Features The SCANPSC110F Bridge extends the IEEE Std. 1149.1 test bus into a multidrop test bus environment. The advan­

FDC9268

Abstract: FSA2501M FSA2510 fsa2501 FSA2510M smd diode marking code TO3 FSA3130M TRANSISTOR SMD MARKING CODE QA lmc64841 CB0239W-MSP
Contextual Info: N MILITARY / AEROSPACE DESIGN/PROCESS CHANGE NOTIFICATION PCN Nr: 1996 Listing GIDEP Nr: Issued: 23.12.96 GIDEP Category: TRB Nr: This is to advise you that a Design and/or Process Change will be made to the following MIL/AERO product s : Product ID (Description):

Contextual Info: S E M IC O N D U C T O R tm SCANPSC110F SCAN Bridge Hierarchical and Multidrop Addressable JTAG Port IEEE1149.1 System Test Support General Description Features The SC AN PSC 110F Bridge extends th e IEEE Std. 1149.1 test bus into a m ultidrop test bus environm ent. The advan­

SCANPSC110FFMQB

Abstract: PSC11 SCANPSC110F SCANPSC110FDMQB SCANPSC110FLMQB SCANPSC110FSC SCANPSC110FSCX
Contextual Info: + / March 1998 P A IF ?C H II_ D SEMICONDUCTOR i SCANPSC110F SCAN Bridge Hierarchical and Multidrop Addressable JTAG Port (IEEE1149.1 System Test Support) General Description Features The SC ANPSC 110F Bridge extends th e IEEE Std. 1149.1 test bus into a m ultidrop test bus environm ent. The advan­

16 BIT SHIFT REGISTER

Abstract: PSC11
Contextual Info: I R C H I L D SEMICONDUCTOR tm SCANPSC110F SCAN Bridge Hierarchical and Multidrop Addressable JTAG Port IEEE1149.1 System Test Support General Description Features The SC AN PSC 110F Bridge extends th e IEEE Std. 1149.1 test bus into a m ultidrop te st bus environm ent. The advan­