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    statistical process control

    Abstract: AN5063 spcc APP5063 yield
    Text: Maxim > Design Support > App Notes > A/D and D/A Conversion/Sampling Circuits > APP 5063 Maxim > Design Support > App Notes > Automatic Test Equipment ATE > APP 5063 Maxim > Design Support > App Notes > Digital Potentiometers > APP 5063 Keywords: statistical process control, yield defects, Gaussian distribution, Six Sigma, prediction yield analysis, defect opportunity per


    Original     		com/an5063 AN5063, APP5063, Appnote5063, statistical process control AN5063 spcc APP5063 yield PDF