79R3000
Abstract: No abstract text available
Text: Bicameral CacheRAM” 288K 16K x 9 x 2 FOR RISC CACHES PRELIMINARY 71B229S FEATURES: DESCRIPTION: • Supports the R3000 and R3001 to 40MHz • Bicam eral organization: — Split instruction/data cache support — No bank-switching timing contention
|
OCR Scan
|
IDT71B229S
R3000
R3001
40MHz
32-pin
300mil
IDT71B229
IDT79R3000
128KB
79R3000
|
PDF
|
TSOP 173 g
Abstract: T 9527 9438 diode DATASHEET OF IC 741 SOJ-28 A101 A102 A104 A106 A110
Text: INTEGRATED DEVICE TECHNOLOGY, INC. QUALITY & RELIABILITY MONITORS January 1996 IDT QUALITY SERVICE QSP PERFORMANCE 3001 Stender Way, Santa Clara, CA 95054 TEL: 408 727-6116 FAX: (408) 492-8362 IDT QUALITY & RELIABILITY MONITOR REPORT January 1996 TABLE OF CONTENTS
|
Original
|
SOJ-28
11256L
11V256C
71028T
71024T
SOJ-32
TSOP 173 g
T 9527
9438 diode
DATASHEET OF IC 741
SOJ-28
A101
A102
A104
A106
A110
|
PDF
|
IDT71B229S
Abstract: No abstract text available
Text: Bicameral CacheRAM™ 288K 16K X 9 X 2 FOR RISC CACHES PRELIMINARY 71B229S Integrated Device Technology, Inc. FEATURES: DESCRIPTION: • Supports the R 3000, R 3500 and R3001 to 40 M H z • B icam eral organization: Th e ID T 7 1B 229 is a B icam eral C ach eR A M specifically
|
OCR Scan
|
IDT71B229S
R3001
32-pin
IDT71B229S
200mV
71B229
300-mil
S032-2)
|
PDF
|
power supply ic 9435
Abstract: 9435 72 datasheet and application 7217 malaysia IC report on PLCC v9452 100A484 a106 diode MQUAD PDIP-48
Text: INTEGRATED DEVICE TECHNOLOGY, INC. QUALITY & RELIABILITY MONITORS January 1996 IDT QUALITY SERVICE QSP PERFORMANCE 3001 Stender Way, Santa Clara, CA 95054 TEL: 408 727-6116 FAX: (408) 492-8362 IDT QUALITY & RELIABILITY MONITOR REPORT January 1996 TABLE OF CONTENTS
|
Original
|
SOJ-28
11256L
11V256C
71028T
71024T
SOJ-32
power supply ic 9435
9435 72
datasheet and application 7217
malaysia IC
report on PLCC
v9452
100A484
a106 diode
MQUAD
PDIP-48
|
PDF
|
Untitled
Abstract: No abstract text available
Text: ft fdt BiCameral CacheRAM™ 288K 16K x 9 x 2) FOR RISC CACHES PRELIMINARY 71B229S Integrated Devi ce Technology, Inc. FEATURES: DESCRIPTION: Supports the R3000, R3500 and R3001 to 40MHz Bicam eral organization-. — Split instruction/data cache support
|
OCR Scan
|
IDT71B229S
R3000,
R3500
R3001
40MHz
32-pin
IDT71B229
79R3000
128KByte
R3000
|
PDF
|
power supply ic 9435
Abstract: 9435, ic ic 9435 9435 49C460 malaysia IC olin 7026 SRAM 6116 report on PLCC f 9222 l
Text: INTEGRATED DEVICE TECHNOLOGY, INC. QUALITY & RELIABILITY MONITORS JULY 1995 IDT QUALITY SERVICE QSP PERFORMANCE 3001 Stender Way, Santa Clara, CA 95054 TEL: 408 727-6116 FAX: (408) 492-8362 IDT QUALITY & RELIABILITY MONITOR REPORT JULY 1995 TABLE OF CONTENTS
|
Original
|
PDIP-28
SOIC-28
11V256
SOJ-28
TQFP-80
71V256
TSOP-28
300cy
power supply ic 9435
9435, ic
ic 9435
9435
49C460
malaysia IC
olin 7026
SRAM 6116
report on PLCC
f 9222 l
|
PDF
|
k 2996
Abstract: s0322 ic dwe
Text: Integrated Device Technology, Inc. Bicameral CacheRAM™ 288K 16K X 9 X 2 FOR RISC CACHES FEATURES: PRELIMINARY 71B229S DESCRIPTION: • Supports the R 3000, R 350 0 and R3001 to 40 M H z • BiCameral organization: — Split instruction/data cache support
|
OCR Scan
|
IDT71B229S
R3001
32-pin
128KByte
IDT71B229S
200mV
71B229
300-mil
S032-2)
k 2996
s0322
ic dwe
|
PDF
|
71B74
Abstract: 6167 ss 9509 A101 A102 A104 A106 A110 11256 9418 had
Text: INTEGRATED DEVICE TECHNOLOGY, INC. QUALITY & RELIABILITY MONITORS JULY 1995 IDT QUALITY SERVICE QSP PERFORMANCE 3001 Stender Way, Santa Clara, CA 95054 TEL: 408 727-6116 FAX: (408) 492-8362 IDT QUALITY & RELIABILITY MONITOR REPORT JULY 1995 TABLE OF CONTENTS
|
Original
|
PDIP-28
SOIC-28
11V256
SOJ-28
TQFP-80
71V256
TSOP-28
300cy
71B74
6167
ss 9509
A101
A102
A104
A106
A110
11256
9418 had
|
PDF
|