5519A Search Results

Contextual Info: Model 6544 Rigid Back Probe Pin FEATURES: Test tip adapter has been designed to IEC 1010, which is the latest international safety standard. Snaps onto Pomona’s DMM Probes with .080" 2 mm O.D. Tips, such as model 5519A. Adapter allows access to hard to reach test points.

Contextual Info: Model 5519A IEC61010 Compliant Replacement Test Leads for Sheathed Style DMM’s PROTECTIVE CAP FEATURES •        Designed for Fluke, H-P, Tektronix and Wavetek DMM’s with a safety of sheathed banana jack. Probe body incorporates a two step mold process. First

55199

Abstract: DAC51 LC74411N LC74411NE
Contextual Info: Ordering number : EN*5519A CMOS LSI LC74411N, LC74411NE PIP Controller Preliminary Overview Package Dimensions The LC74411N and LC74411NE are digital processing controllers for PIP picture-in-picture systems in TV sets and VCRs. These ICs incorporate three circuits, a

Contextual Info: Model 6262 Fine Point Extended Test Probe Adapter FEATURES: Test tip adapter has been designed to IEC 1010, which is the latest international safety standard. Snaps onto Pomona’s DMM Probes with .080" 2 mm O.D. Tips, such as model 5519A. Adapter allows access to hard to reach test points.

ic 55199

Abstract: 55199 DAC51 5519B ILC02758 ILC02759 ILC02769 ILC02770 LC74411N LC74411NE
Contextual Info: 注文コード No. N ※ 5519B LC74411N, 74411NE No. N ※ 5519B 22806 開発ニューズ No. ※ 5519A とさしかえてください。 LC74411N LC74411NE CMOS LSI PIP コントローラ 概要 LC74411N, 74411NE はTV, VTR 等における PIP（Picture In Picture）システムのデジタル処理コントローラであ

tips

Contextual Info: Model 6262 Fine Point Extended Test Probe Adapter FEATURES: Test tip adapter has been designed to IEC 1010, which is the latest international safety standard. Snaps onto Pomona’s DMM Probes with .080" 2 mm O.D. Tips, such as model 5519A. Adapter allows access to hard to reach test points.

Contextual Info: Model 6574 Alligator Clip With Boot for standard test probe tip, .080” 2mm (probe not included) FEATURES: • Complies to International Safety Standard IEC 1010-2-031 • Alligator Clip will attach to terminals up to .30” (7.62mm) outside diameter. • Adapts standard .080” (2mm) style test probe, such as the Pomona model 5519A test probe.

IEC-1010-2-031

Abstract: santoprene silicone red rubber
Contextual Info: Pomona Model 5519A IEC 1010 Compliant Replacement Test Leads For Sheathed Style DMM’s FEATURES: • Designed for Fluke, H-P, Tektronix and Wavetek DMM’s with a safety style of sheathed banana jack. • Probe body incorporates a two step mold process. First step is Polypropylene for probe rigidity. Second

interferometer

Abstract: E1735A E1735A USB Axis Module Axis Agilent CALIBRATOR DSA00558 5989-9708EN E1735
Contextual Info: E1735A USB Axis Module Data Sheet The Agilent E1735A USB Axis Module is the electronic interface for the 5519A/B laser head used in the Agilent 5530 Dynamic Calibrator system. The axis module also provides the interface for both the optional remote control unit and optional A-quad-B encoder

Contextual Info: Agilent E1735A USB Axis Module Data Sheet The Agilent E1735A USB Axis Module is the electronic interface for the 5519A/B laser head used in the Agilent 5530 Laser Calibration System. The axis module also provides the interface for both the optional remote control

ic 55199

Contextual Info: Ordering number : EN*5519A CMOS LSI LC74411N, LC74411NE PIP Controller Preliminary Overview Package Dimensions The LC74411N and LC74411NE are digital processing controllers for PIP picture-in-picture systems in TV sets and VCRs. These ICs incorporate three circuits, a

a5 vne

Abstract: 55199
Contextual Info: Ordering number : ENJK 5519A CMOS LSI LC74411N, LC74411NE No. * 5 5 1 9 A S A IV O j PIP Controller Preliminary Overview Package Dimensions The LC74411N and LC74411NE are digital processing controllers for PIP picture-in-picture systems in TV sets and V C R s. T h e se ICs in c o rp o ra te th re e c irc u its , a

55199

Abstract: ic 55199
Contextual Info: Ordering number : EN*5519A CMOS LSI LC74411N, LC74411NE PIP Controller Preliminary Overview Package Dimensions The LC74411N and LC74411NE are digital processing controllers for PIP picture-in-picture systems in TV sets and VCRs. These ICs incorporate three circuits, a

Contextual Info: Model 6574 Alligator Clip With Boot for standard test probe tip, .080” 2mm 1000V CAT III 10A (probe not included) FEATURES: 9 Complies with International Safety Standard IEC 1010-2-031 9 Alligator will clip around terminals up to .30” (7.62mm) outside diameter.

schematic diagram atx Power supply 500w

Abstract: pioneer PAL 012A 1000w inverter PURE SINE WAVE schematic diagram 600va numeric ups circuit diagrams winbond bios 25064 TLE 9180 infineon smsc MEC 1300 nu TBE schematic diagram inverter 2000w DK55 circuit diagram of luminous 600va UPS
Contextual Info: QUICK INDEX NEW IN THIS ISSUE! Detailed Index - See Pages 3-24 Digital Signal Processors, iCoupler , iMEMS® and iSensor . . . . . 805, 2707, 2768-2769 Connectors, Cable Assemblies, IC Sockets . . . . . . . . . . . 28-568 RF Connectors . . . . . . . . . . . . . . . . . . . . . . Pages 454-455

tektronix C1001

Abstract: 885-0912 885-0918
Contextual Info: P o m o n a Electronics Test Clips, Adapters and Grabbers Test Clips Test Adapters SMD Grabber¨ Test Clips Do-It-Yourself SMD Grabber Test Clip Do-it-yourself test clip especially suited for testing surface mounted packages on centers as small as .030". Pincer-like

Contextual Info: Professionals Trust Pomona Performance Test and Measurement Calibration RF Audio / Video / Broadcast Automotive Telecom 2013 RoHS www.pomonaelectronics.com Table of Contents 2 3 New Products 5 Customized Products 6 Coaxial Cable Assemblies and Breakouts For over half a

Contextual Info: 製品カタログ 新製品のご案内 オシロスコープ用差動プローブ • POMONA社の差動電圧プローブに より接地されたオシロスコープ を使いながら高電圧のフローティ ング測定を安全に行なうことがで

Wavetek HD160

Abstract: tektronix DM250 IEC1010 fluke 8012A BDM40
Contextual Info: a n d K its_ Depend on Pomona for Reliable Test Results Pomona continues to offer a complete selection of the most dependable DMM accessories available anywhere. Superior materials, robust designs and the highest quality craftsmanship

pomona 1269

Abstract: 5953A bnc to probe clips mini jack smd pogo-pin agilent 5517 Wavetek 10C100
Contextual Info: 127-2012:QuarkCatalogTempNew 8/13/12 5:48 PM Page 127 1 DMM Test Leads/Kits Silicone test leads remain flexible in hot or cold environments. Insulation resists burning or melting in contact with soldering irons. Plugs and jacks are compatible with most digital multimeters made by Fluke, HP Agilent , Wavetek, Meterman and others.

E1735A

Abstract: 5519B E1735A USB Axis Module 10753B E1738A E1736A tripod 10888A 55290B 10766A
Contextual Info: Agilent 5530 Dynamic Calibrator Data Sheet Power Requirements System Requirements Laser Head: 100 – 240 Vac, 50/60 Hz 50W during warmup , 33W (after warmup) Environmental Operating Temperature: 0 – 40°C (32 – 104°F) Optics temperature must be stabilized to ±2°C to

MC2259

Abstract: MC880P MC9713P mc2257 1N4003 germanium diode specification 2N1256 S P 1N4465 MC9802P MC9718P 3N214
Contextual Info: Semiconductor Data Library Master Index prepared by Technical Information Center The information in this book has been carefully checked and is believed to be reliable; however, no responsibility is assumed for inaccuracies. Furthermore, this information does not convey to the

5519A

Abstract: 6264 digital multi meter
Contextual Info: Pomona Model 6343 Basic Electronic Test Lead Kit FEATURES: • Test accessories comply with IEC 1010-2-031 and UL requirements • Test clips with a right angle banana plug is ideal for use with hand held digital multi meter • Extended slide on tip adapter fits directly over probe, allowing testing of hard to reach test points

Contextual Info: Agilent 10768A Diagonal Measurement Kit Data Sheet 10768A Diagonal Measurement Kit is designed for use with the Agilent 5530 Laser Calibration System. It allows linear measurements to be made on the four body diagonals of a machine tool’s working volume. These measurements document the machine’s capability and quickly perform a complete check of volumetric positioning performance. In addition, long-term drift tests can be performed