2a92
Abstract: 27C010A 6E9621 6B9637 3A9315 3E0317 5A9516 5C9550 1B9126 2D1150-9
Text: PAGE 1 OF 20 ATMEL CORPORATION Tel: 408 441-0311 Fax:(408)436-4200 AT-27C010 CMOS EPROM RELIABILITY DATA -125°C OPERATING LIFE TEST -200°C RETENTION BAKE -PROGRAM AND ERASE -HIGH TEMPERATURE REVERSE BIAS (HTRB) -125°C OPERATING LIFE TEST (PLASTIC) -150°C RETENTION BAKE (PLASTIC)
|
Original
|
AT-27C010
AT-27C010
E901-14056
2D1147-12
2a92
27C010A
6E9621
6B9637
3A9315
3E0317
5A9516
5C9550
1B9126
2D1150-9
|
PDF
|
27C1024
Abstract: MIL-M-38535 2C9237 4B942 3B93
Text: PAGE 1 OF 12 ATMEL CORPORATION Tel: 408 441-0311 Fax:(408)436-4200 AT-27C1024 CMOS EPROM RELIABILITY DATA -125°C OPERATING LIFE TEST -200°C DATA RETENTION BAKE -PROGRAM AND ERASE -125°C OPERATING LIFE TEST (PLASTIC) -150°C RETENTION BAKE (PLASTIC) -15 PSIG PRESSURE POT
|
Original
|
AT-27C1024
MIL-M-38535
AT-27C010
AT-27C1024
27C1024
2C9237
4B942
3B93
|
PDF
|
5A9516
Abstract: 5H9606 5H9605 7H9744 2A9212 5A9524 7H9747 9d9018 5c112 1B9126
Text: PAGE 1 OF 20 ATMEL CORPORATION Tel: 408 441-0311 Fax:(408)436-4200 AT-27C010 CMOS EPROM RELIABILITY DATA -125°C OPERATING LIFE TEST -200°C RETENTION BAKE -PROGRAM AND ERASE -HIGH TEMPERATURE REVERSE BIAS (HTRB) -125°C OPERATING LIFE TEST (PLASTIC) -150°C RETENTION BAKE (PLASTIC)
|
Original
|
AT-27C010
AT-27C010
E901-14056
2D1147-12
5A9516
5H9606
5H9605
7H9744
2A9212
5A9524
7H9747
9d9018
5c112
1B9126
|
PDF
|
TSOP 173 g
Abstract: 5H9602 6c9648 3b1326 5G9551 MIL-M-38535 6F9627 4c19 3C1660 atmel 906
Text: PAGE 1 OF 21 ATMEL COPORATION Tel: 408 441-0311 Fax:(408)436-4200 AT-27C040 CMOS EPROM RELIABILITY DATA* -125°C DYNAMIC OPERATING LIFE TEST -200°C RETENTION BAKE -PROGRAM AND ERASE -125°C OPERATING LIFE TEST (PLASTIC) -150°C RETENTION BAKE (PLASTIC) -15 PSIG PRESSURE POT
|
Original
|
AT-27C040
MIL-M-38535
AT-27C1024
AT-27C512R
AT-27C010
AT-27C040
12C/TSOP/SOIC/PDIP
6D9702
8B9832
TSOP 173 g
5H9602
6c9648
3b1326
5G9551
6F9627
4c19
3C1660
atmel 906
|
PDF
|
Untitled
Abstract: No abstract text available
Text: 1 1 1 1223456457 1234567894A2B894CDEF4244797 4D!87 8"4 *#4DFA*-&'$%*FA4 #$%&'# 4 4 -A9 ! -A9 ! 56 #" 895A # 733 733 -A9 -A9 5/4263 !! ! !" % 9$"! & 9652 $ 38-2. + 5693. # 733456 ! 8-./0 5693 " 38-2 # + $ & % 123
|
Original
|
1234567894A2B894CDEF4
9344A576B
98/D787AB
87D76B
9647A
D74D93
//96B-4
6518918F51EDC
F51CD15E6
4F8C95
|
PDF
|
tsop 338
Abstract: 28c010 28C010 Atmel 4C016 4b23 4h5229 4A05 MIL-M-38535 2D93 6F9630
Text: PAGE 1 OF 10 ATMEL CORPORATION Tel: 408 441-0311 Fax:(408)436-4200 AT-28C010 CMOS EEPROM RELIABILITY DATA* - 150°C DYNAMIC OPERATING LIFE TEST - CYCLE TEST - 200°C RETENTION BAKE - 125°C OPERATING LIFE TEST (PLASTIC) - 150°C RETENTION BAKE (PLASTIC) - 15 PSIG PRESSURE POT
|
Original
|
AT-28C010
MIL-M-38535
AT-28C256
AT-28C040
AT-28C010
7G9822
6H9708
9G9937
9G9939
tsop 338
28c010
28C010 Atmel
4C016
4b23
4h5229
4A05
2D93
6F9630
|
PDF
|
29C256
Abstract: 29C257 report on PLCC tsop 6 MIL-M-38535 3A0081
Text: PAGE 1 OF 8 ATMEL CORPORATION Tel: 408 441-0311 Fax: (408) 436-4200 AT-29C256 PEROM RELIABILITY DATA - 125°C DYNAMIC OPERATING LIFE TEST - CYCLE TEST - 200°C RETENTION BAKE - 125°C DYNAMIC LIFE TEST (PLASTIC) - 125°C RETENTION BAKE (PLASTIC) - 15 PSIG PRESSURE POT
|
Original
|
AT-29C256
MIL-M-38535
AT-29C257
AT-29C256
2D9303
3A9313
3A9318
3B9324
29C256
29C257
report on PLCC
tsop 6
3A0081
|
PDF
|
29C040
Abstract: AT29C040 4D9511
Text: PAGE 1 OF 7 ATMEL CORPORATION Tel: 408 441-0311 Fax: (408) 436-4200 AT-29C040 PEROM RELIABILITY DATA - 125°C DYNAMIC OPERATING LIFE TEST - 200°C RETENTION BAKE - CYCLE TEST - 125°C OPERATING LIFE TEST (PLASTIC) - 150°C RETENTION BAKE (PLASTIC) - 15 PSIG PRESSURE POT
|
Original
|
AT-29C040
AT-29C040
3C0380
4A1756
4C1203
4C0945
4H5199
4D2648
5E0635
3C9342
29C040
AT29C040
4D9511
|
PDF
|
27c512r
Abstract: ATMEL AT27c512 8a039 6J24 233759A-13 4b23 3C1091 2d9306 9c9949 5c2484
Text: PAGE 1 OF 17 ATMEL CORPORATION Tel: 408 441-0311 Fax:(408)436-4200 AT-27C512R CMOS EPROM RELIABILITY DATA* -125°C OPERATING LIFE TEST -150°C HIGH TEMPERATURE REVERSE BIAS (HTRB) -200°C RETENTION BAKE -PROGRAM/ERASE CYCLE -125°C OPERATING LIFE TEST (PLASTIC)
|
Original
|
AT-27C512R
MIL-M-38510
AT-27C256R
AT-27C010
AT-27C512/512R
2J0301
4J0451
6J0707
7F0721
27c512r
ATMEL AT27c512
8a039
6J24
233759A-13
4b23
3C1091
2d9306
9c9949
5c2484
|
PDF
|
28HC64
Abstract: 28PC64 28HC16 MIL-M-38535 9C8944 Activation Energy
Text: PAGE 1 OF 6 ATMEL CORPORATION Tel: 408 441-0311 Fax:(408)436-4200 AT-28HC64 CMOS EEPROM RELIABILITY DATA* - 125°C DYNAMIC OPERATING LIFE TEST - 200°C RETENTION BAKE - 125°C DYNAMIC OPERATING LIFE TEST (PLASTIC) - 15 PSIG PRESSURE POT - CYCLE TEST * This report was generated from AT-28HC64 reliability testing.
|
Original
|
AT-28HC64
MIL-M-38535
AT-28HC191/291
AT-28PC64
AT-28C256
AT-28HC16/17
AT-28HC64
033474C
234583C1
28HC64
28PC64
28HC16
9C8944
Activation Energy
|
PDF
|
29C256
Abstract: 29C257 PLCC 64
Text: PAGE 1 OF 8 ATMEL CORPORATION Tel: 408 441-0311 Fax: (408) 436-4200 AT-29C256 PEROM RELIABILITY DATA - 125°C DYNAMIC OPERATING LIFE TEST - CYCLE TEST - 200°C RETENTION BAKE - 125°C DYNAMIC LIFE TEST (PLASTIC) - 125°C RETENTION BAKE (PLASTIC) - 15 PSIG PRESSURE POT
|
Original
|
AT-29C256
MILM-38535
AT-29C257
AT-29C256
2D9303
3A9313
3A9318
3B9324
29C256
29C257
PLCC 64
|
PDF
|