4142B Search Results
4142B Price and Stock
TDK Corporation TAS4142-BAACMAGNETIC ANGLE SENSOR, AUTOMOTIV |
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TAS4142-BAAC | Digi-Reel | 5,108 | 1 |
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TAS4142-BAAC | 15 Weeks | 3,000 |
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TAS4142-BAAC | 12 Weeks, 6 Days | 3,000 |
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TDK Electronics B84142B0008R000LINE FILTER 250VAC/VDC 8A CHASS |
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B84142B0008R000 | Tray | 9 | 1 |
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B84142B0008R000 | Bulk | 11 | 1 |
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TDK Electronics B84142B0012R000LINE FILTER 250VAC/VDC 12A CHASS |
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B84142B0012R000 | Bulk | 7 | 1 |
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B84142B0012R000 | Bulk | 1 |
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Hammond Manufacturing 1441-42BK3CHASSIS STEEL BLACK 17"L X 14"W |
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1441-42BK3 | Bulk | 2 | 1 |
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1441-42BK3 | 2 |
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1441-42BK3 | Bulk | 58 | 1 |
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1441-42BK3 | Bulk | 1 |
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1441-42BK3 | 1 |
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1441-42BK3 | 1 | 1 |
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1441-42BK3 | 38 | 1 |
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1441-42BK3 |
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TDK Electronics B84142B0016R000LINE FILTER 250VAC/VDC 16A CHASS |
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B84142B0016R000 | Box | 2 | 1 |
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B84142B0016R000 | Bulk | 22 | 1 |
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4142B Datasheets (1)
Part | ECAD Model | Manufacturer | Description | Curated | Datasheet Type | |
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4142-B | Brady Worldwide | 4142-B TOWER WATER/GRN/STY B | Original |
4142B Datasheets Context Search
Catalog Datasheet | Type | Document Tags | |
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404829
Abstract: HD404829FS HD404829 441L204 06E 906 051 K
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OCR Scan |
HD404829 HMCS400-series 32-kHz HD404829 HD404828 12-kword 16-kword HD4048212 HD4074829 404829 HD404829FS 441L204 06E 906 051 K | |
SE 7889 LFContextual Info: Agilent E5240A I/CV Automation Software Data Sheet Overview Agilent I/CV software provides automated test solutions for semiconductor characterization. I/CV supports semiconductor parameter analyzers, C-V meters, low leakage switch matrices, and popular wafer probers. It also |
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E5240A 4085M E5240A E5240AU 5988-4399EN SE 7889 LF | |
accretech UF3000
Abstract: UF3000
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E5240C E5241C E5240CU 5989-1408EN accretech UF3000 UF3000 | |
High Volume Test Methodology for HBT Device Ruggedness Characterization
Abstract: kopin
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17th-20th, High Volume Test Methodology for HBT Device Ruggedness Characterization kopin | |
Contextual Info: S Agilent 4157A Modular Semiconductor Parameter Analyzer Data Sheet Introduction The Agilent 4157A Modular Semiconductor Parameter Analyzer combines the hardware flexibility of the Agilent E5270A 8-Slot Parametric Measurement Mainframe with the software versatility of I/CV 2.1 Lite Automation Software. |
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E5270A E5270A 2357A 5988-9162EN | |
"asynchronous Dual-Port RAM"
Abstract: RAM SEU IO33 32K 4K x 8 Synchronous Dynamic RAM
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25-Mbit 4142B "asynchronous Dual-Port RAM" RAM SEU IO33 32K 4K x 8 Synchronous Dynamic RAM |