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    4142B Search Results

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    4142B Price and Stock

    TDK Corporation TAS4142-BAAC

    MAGNETIC ANGLE SENSOR, AUTOMOTIV
    Distributors Part Package Stock Lead Time Min Order Qty Price Buy
    DigiKey () TAS4142-BAAC Digi-Reel 5,108 1
    • 1 $11.98
    • 10 $10.107
    • 100 $8.8106
    • 1000 $7.90902
    • 10000 $7.90902
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    TAS4142-BAAC Cut Tape 5,108 1
    • 1 $11.98
    • 10 $10.451
    • 100 $9.3061
    • 1000 $8.44728
    • 10000 $8.44728
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    TAS4142-BAAC Reel 3,000 3,000
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    Avnet Abacus TAS4142-BAAC 15 Weeks 3,000
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    Avnet Asia TAS4142-BAAC 12 Weeks, 6 Days 3,000
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    TDK Electronics B84142B0008R000

    LINE FILTER 250VAC/VDC 8A CHASS
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    DigiKey B84142B0008R000 Tray 9 1
    • 1 $120.41
    • 10 $120.41
    • 100 $104.15875
    • 1000 $104.15875
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    Newark B84142B0008R000 Bulk 11 1
    • 1 $133.52
    • 10 $122.25
    • 100 $116.62
    • 1000 $116.62
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    TDK Electronics B84142B0012R000

    LINE FILTER 250VAC/VDC 12A CHASS
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    DigiKey B84142B0012R000 Bulk 7 1
    • 1 $130.5
    • 10 $130.5
    • 100 $114.00375
    • 1000 $114.00375
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    Newark B84142B0012R000 Bulk 1
    • 1 $129.31
    • 10 $120.6
    • 100 $120.6
    • 1000 $120.6
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    Hammond Manufacturing 1441-42BK3

    CHASSIS STEEL BLACK 17"L X 14"W
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    DigiKey 1441-42BK3 Bulk 2 1
    • 1 $79.63
    • 10 $63.623
    • 100 $61
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    Mouser Electronics 1441-42BK3 2
    • 1 $79.59
    • 10 $63.62
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    Newark 1441-42BK3 Bulk 58 1
    • 1 $83.46
    • 10 $66.7
    • 100 $66.7
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    RS 1441-42BK3 Bulk 1
    • 1 $80.94
    • 10 $68.8
    • 100 $68.8
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    Bisco Industries 1441-42BK3 1
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    TME 1441-42BK3 1 1
    • 1 $64.26
    • 10 $53.55
    • 100 $49.98
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    Powell Electronics 1441-42BK3 38 1
    • 1 $95.82
    • 10 $95.82
    • 100 $95.82
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    Master Electronics 1441-42BK3
    • 1 $85
    • 10 $76.38
    • 100 $70.27
    • 1000 $70.27
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    TDK Electronics B84142B0016R000

    LINE FILTER 250VAC/VDC 16A CHASS
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    DigiKey B84142B0016R000 Box 2 1
    • 1 $141.67
    • 10 $141.67
    • 100 $125.005
    • 1000 $125.005
    • 10000 $125.005
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    Newark B84142B0016R000 Bulk 22 1
    • 1 $307.56
    • 10 $297.19
    • 100 $296.17
    • 1000 $296.17
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    4142B Datasheets (1)

    Part ECAD Model Manufacturer Description Curated Datasheet Type PDF
    4142-B
    Brady Worldwide 4142-B TOWER WATER/GRN/STY B Original PDF

    4142B Datasheets Context Search

    Catalog Datasheet Type Document Tags PDF

    404829

    Abstract: HD404829FS HD404829 441L204 06E 906 051 K
    Contextual Info: H D 404829 S e r ie s Description The HD404829 Series is an HMCS400-series microcomputer designed to increase program productivity and also incorporate large-capacity memory. Each microcomputer has an LCD controller/driver, A/D converter, input capture circuit, 32-kHz oscillator for clock use, and four


    OCR Scan
    HD404829 HMCS400-series 32-kHz HD404829 HD404828 12-kword 16-kword HD4048212 HD4074829 404829 HD404829FS 441L204 06E 906 051 K PDF

    SE 7889 LF

    Contextual Info: Agilent E5240A I/CV Automation Software Data Sheet Overview Agilent I/CV software provides automated test solutions for semiconductor characterization. I/CV supports semiconductor parameter analyzers, C-V meters, low leakage switch matrices, and popular wafer probers. It also


    Original
    E5240A 4085M E5240A E5240AU 5988-4399EN SE 7889 LF PDF

    accretech UF3000

    Abstract: UF3000
    Contextual Info: Agilent E5240C I/CV 3.0 Automaton Software Agilent E5240C I/CV 3.0 Lite Automaton Software Technical Overview Overview Agilent I/CV 3.0 and I/CV 3.0 Lite automation software provide auto mated test solutions for semiconductor characterization. Both versions support semiconductor


    Original
    E5240C E5241C E5240CU 5989-1408EN accretech UF3000 UF3000 PDF

    High Volume Test Methodology for HBT Device Ruggedness Characterization

    Abstract: kopin
    Contextual Info: High Volume Test Methodology for HBT Device Ruggedness Characterization Cristian Cismaru, Hal Banbrook, and Peter J. Zampardi Skyworks Solutions, Inc., 2427 Hillcrest Drive, Newbury Park, CA 91320 cristian.cismaru@skyworksinc.com, 805.480.4663 Keywords: BVceo, snap-back, HBT, high-volume test, ruggedness


    Original
    17th-20th, High Volume Test Methodology for HBT Device Ruggedness Characterization kopin PDF

    Contextual Info: S Agilent 4157A Modular Semiconductor Parameter Analyzer Data Sheet Introduction The Agilent 4157A Modular Semiconductor Parameter Analyzer combines the hardware flexibility of the Agilent E5270A 8-Slot Parametric Measurement Mainframe with the software versatility of I/CV 2.1 Lite Automation Software.


    Original
    E5270A E5270A 2357A 5988-9162EN PDF

    "asynchronous Dual-Port RAM"

    Abstract: RAM SEU IO33 32K 4K x 8 Synchronous Dynamic RAM
    Contextual Info: Features • Comprehensive Library of Standard Logic Cells • MH2RT I/O Cells Designed to Operate With VDD 2.5V + 0.2V as Main Target Operating • • • • • • • • • • • • • • • Conditions IO33 Pad Library Provides Interface to 3.3V Environment


    Original
    25-Mbit 4142B "asynchronous Dual-Port RAM" RAM SEU IO33 32K 4K x 8 Synchronous Dynamic RAM PDF