p-iris control
Abstract: No abstract text available
Text: Am27S65 Am27S65 4096-Bit 1 0 2 4 x 4 Bipolar Registered PROM with SSR Diagnostics Capability DISTINCTIVE CHARACTERISTICS On-chip diagnostic shift register for serial observability and controllability of the output register User-programmable Enable Pin for Asynchronous or
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OCR Scan
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Am27S65
4096-Bit
24-pin,
300-mil
BD005830
27S65A
27S65
p-iris control
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PDF
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29MA16
Abstract: am27s47a AM27S45a AM27S45s Am27S85 Am27LS291 AM27S85A CD3024 PD3024
Text: A m P A L * H C 2 9 M A 16 /A m P A L H C T 2 9 M A 16 24-Pin E2-Based CMOS Programmable Array Logic ADVANCE INFORMATION • • • • H igh-perform ance sem i-custom logic replacem ent; E lectrically Erasable E2 technology allows repro gram mability
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OCR Scan
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HC29MA16/AmPALHCT29MA16
24-Pin
standa75mA
Am27S75A
25ns/12ns/175mA
Am27S291
35ns/185mA
Am27LS291
30ns/90mA
Am27S291SA
29MA16
am27s47a
AM27S45a
AM27S45s
Am27S85
AM27S85A
CD3024
PD3024
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PDF
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27S55A
Abstract: No abstract text available
Text: AmPAL* HC29MA16/AmPALHCT29MA16 24-Pin E2-Based C M O S Programmable Array Logic A D VA N C E INFORMATION • Register/Latch PR E L O A D permits full logical verifica tion • Available in high-speed tpo “ 35 ns, fMAX = 20 MHz and standard-speed (tpo ” 45 ns, fMAX “ 15.0 MHz)
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OCR Scan
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HC29MA16/AmPALHCT29MA16
24-Pin
300-mil
28-pin
PAL29MA16
7S45A
40ns/20ns/185mA
27S45SA
25ns/10ns/185mA
27S55A
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PDF
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Untitled
Abstract: No abstract text available
Text: Am 27S65 Am27S65 4096-Bit 1 0 2 4 x 4 Bipolar Registered PROM with SSR Diagnostics Capability DISTINCTIVE CHARACTERISTICS • • • • On-chip diagnostic shift register for serial observability and controllability of the output register User-programmable Enable Pin for Asynchronous or
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OCR Scan
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Am27S65
4096-Bit
1024x4)
24-pin,
300-mil
BD005830
27S65A
27S65
27S65
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PDF
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Untitled
Abstract: No abstract text available
Text: Am 27S65 Am27S65 4096-Bit 1 0 2 4 x 4 Bipolar Registered PROM with SSR Diagnostics Capability DISTINCTIVE CHARACTERISTICS • • • • On-chip diagnostic shift register for serial observability and controllability of the output register User-programmable Enable Pin for Asynchronous or
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OCR Scan
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Am27S65
4096-Bit
1024x4)
24-pin,
300-mil
BD005830
27S65A
27S65
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PDF
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Untitled
Abstract: No abstract text available
Text: Am27S65 4096-Bit 1 0 2 4 x 4 Bipolar Registered PROM with SSR Diagnostics Capability DISTINCTIVE CHARACTERISTICS • • • • On-chip diagnostic shift register for serial observability and controllability of the output register User-programmable Enable Pin for Asynchronous or
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OCR Scan
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Am27S65
4096-Bit
24-pin,
300-mil
BD005830
27S65A
27SS5
27S65
CD000541
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PDF
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af0001
Abstract: No abstract text available
Text: Am27S65 4096-Bit 1 0 2 4 x 4 Bipolar Registered PROM with SSR Diagnostics Capability • • • • On-chip diagnostic shift register for serial observability and controllability of the output register User-programmable Enable Pin for Asynchronous or
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OCR Scan
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Am27S65
4096-Bit
24-pin,
300-mil
MIL-STD-883,
af0001
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PDF
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