DSA00507473.pdf by Harris Semiconductor

Partial File Text S E M I C O N D U C T O R RR002 Intelligent Power Products Reliability Report April 1992 CONCURRENT DESIGN, TEST AND RELIABILITY ENGINEERING OF POWER ASICs By Erwin A. Herr Introduct
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Harris catalogue ISSN-0018-9529 Reliability Test Methods for Packaged Devices Surface mount NPN/PNP complementary transistor Thermal Test-Element-Group transistors mos