DSACRA000020174.pdf by HOLT Integrated Circuits

Partial File Text Holt Integrated Circuits Device Reliability Report For Second Quarter 2012 9/30/2012 Document Number: QR-1222, Revision 1.0 Approved by: Scott Paladichuk Director of Quality 23351 Ma
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44PTQS 64PTQS 92691 DO-160G DPM 659 JESD22-A102 JESD22-A104 - TEST CONDITION K JESD22-A110 Unbiased HAST 130, 85 RH, 100 Hrs