DSASW00101780.pdf by Aeroflex

Partial File Text Single Event Effects Qualification UT8Q512K8 (RQ02) Lot 6ZVL04 4Mbit SRAM 7/21/03 Craig Hafer 719-594-8319 craig.hafer@aeroflex.com SUMMARY--Single event effects qualification testing was per
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SRAM Cross References SRAM SAMSUNG UT8Q512K8 UT9Q512K8 weibull test data