DSASW00101781.pdf

Partial File Text Single Event Latch-Up Testing on Samsung Rev. D 4M Fast Asynchronous SRAM Joseph Benedetto, Ph.D. Craig Hafer 719-594-8319 craig.hafer@aeroflex.com Summary--Single event latch-up (SEL) testing
Datasheet Type Original
RoHS Unknown
Pb Free Unknown
Lifecycle Unknown

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K6R4008C1D K6R4008V1D Samsung K6R4008C1D SAMSUNG SRAM

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