DSASW00106886.pdf by Altera

Partial File Text 12. IEEE 1149.1 (JTAG) Boundary-Scan Testing for the Cyclone III Device Family CIII51014-2.2 This chapter provides guidelines on using the IEEE Std. 1149.1 boundary-scan test (BST) circuitry in
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altera cyclone 3 pins EP3C10 EP3C120 EP3C16 EP3C25 EP3C25 pin guideline EP3C40 EP3C55 EP3CLS100 EP3CLS200 EP3CLS70