DSASW00107281.pdf by Altera

Partial File Text 12. JTAG Boundary-Scan Testing in Stratix IV Devices SIV51012-3.1 The IEEE Std. 1149.1 boundary-scan test (BST) circuitry available in Stratix® IV devices provides a cost-effective and efficient
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EP4S40G2 EP4SE230 EP4SE360 EP4SE530 EP4SGX180 EP4SGX290 EP4SGX360 EP4SGX70

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