This site uses third-party website tracking technologies to provide and continually improve our services, and to display advertisements according to users' interests. I agree and may revoke or change my consent at any time with effect for the future.
Hardening CMOS
Hardening a CMOS Technology Against Total Dose and
Heavy Ion Induced LatchÂup
by Thierry CORBIERE, Valerie LASSERE, Bruno THOMAS, Said HACHAD(1)
Robert ECOFFET(2), Sophie DUZELLIE
