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    DSARS008214.pdf by Texas Instruments

    • SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBS045E ­ JUNE 1990 ­ REVISED JULY 1996 D D D D D description The 'BCT8374A scan test devices
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