DSA2H003459.pdf by Aries Electronics

Partial File Text High-Frequency Center ProbeTM Test Socket for Devices up to 55mm Square FEATURES ·For high-frequency test of CSP, BGA, DSP, LGA, SRAM, DRAM and Flash Devices ·Any device on 0.30mm pitch or larger
Datasheet Type Original
RoHS Unknown
Pb Free Unknown
Lifecycle Unknown
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