DSA00296236.pdf by National Semiconductor

Partial File Text National Semiconductor Application Note 989 M Maher R Koga et al The Aerospace Corp April 1995 ABSTRACT A comparison of single event upset and latchup test results for devices operated at se
Datasheet Type Original
RoHS Unknown
Pb Free Unknown
Lifecycle Unknown
Price & Stock
Powered by Findchips

DSA00296236.pdf preview

Download Datasheet

User Tagged Keywords

54AC163 54AC299 54ACT174 54ACT373 AN-989 AT22V10B ma 8920 NS-28 RAM SEU tl 4013 watson smith