DSAE00986.pdf by Sharp

Partial File Text Application Note Optoelectronics Failure Analysis of Optoelectronic Devices DEFINITIONS · US Military Standard: MIL-STD-883 (Method 5003 Failure Analysis Procedures for Microcircuits) Fail
Datasheet Type Original
RoHS Unknown
Pb Free Unknown
Lifecycle Unknown
Price & Stock
Powered by Findchips

DSAE00986.pdf preview

Download Datasheet

User Tagged Keywords

2n2222 micro electronics BREAK FAILURE INDICATOR APPLICATIONS LIST chip die npn transistor CRACK DETECTION PATTERNS dicing and laser grooving Etch Microelectronics gold wire bound failures due to ultrasonic cleaning LCR meter for ICs package mil-std-883* lead fatigue mobile phone ultrasonic relay failure analysis Sharp Semiconductor Lasers tensile-strength thermopile array thermopile gaas transistor QB