DSASW00222513.pdf by Lattice Semiconductor

Partial File Text MachXO2 Soft Error Detection (SED) Usage Guide November 2010 Technical Note TN1206 Introduction Soft errors occur when high-energy charged particles alter the stored charge in a memory cell i
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1200L 2000L 4000L 7000L error correction, verilog source Lattice XO2 TN1206 XO2-1200 XO2-2000 XO2-4000 XO2-640 XO2-7000