DSA0035768.pdf

Partial File Text Reliability Characteristics of M/A-COM's InGaP/GaAs HBT Process Peter Ersland Abstract Life tests have been performed on over 180 HBT devices in an effort to identify the reliability characterist
Datasheet Type Original
RoHS Unknown
Pb Free Unknown
Lifecycle Unknown

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gaas hbt HBT 01 - 05 transistor jce

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