SN74BCT8373ADWG4 datasheet by Texas Instruments

Description IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal D-Type Latches 24-SOIC 0 to 70
Datasheet Type Original
RoHS Yes
Pb Free Yes
Lifecycle Obsolete
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Equivalent Parts !
Always verify details of parts you are evaluating, as these parts are offered as suggestions for what you are looking for and are not guaranteed.

SN74BCT8373ADWRG4 SN74BCT8373DWR SN74BCT8373ADWR SN74BCT8373ADW SN74BCT8373ADWRE4

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