ADS8321E/2K5G4 datasheet by Texas Instruments

ADS8321E/2K5G4 Frequently Asked Questions (FAQs)

• What is the recommended layout and routing for the ADS8321E/2K5G4 to minimize noise and ensure accurate conversions?
  Texas Instruments recommends a 4-layer PCB with a solid ground plane, and to keep the analog and digital signals separate. The analog input traces should be short and direct, and the digital output traces should be routed away from the analog inputs. Additionally, decoupling capacitors should be placed close to the device's power pins.
• How do I handle the device's power-on reset (POR) and what is the recommended power-up sequence?
  The ADS8321E/2K5G4 has a built-in POR circuit that resets the device when the power supply voltage rises above 1.5V. To ensure proper operation, the power supply voltage should be ramped up slowly (less than 10ms) and the digital interface should be held in a reset state until the power supply is stable.
• What is the maximum sampling rate that can be achieved with the ADS8321E/2K5G4, and how does it affect the device's power consumption?
  The maximum sampling rate of the ADS8321E/2K5G4 is 250kSPS. However, the device's power consumption increases with the sampling rate. At 250kSPS, the device consumes around 15mW, while at lower sampling rates (e.g. 100kSPS), the power consumption is around 10mW.
• How do I calibrate the ADS8321E/2K5G4 to achieve the best possible accuracy, and what are the recommended calibration procedures?
  The ADS8321E/2K5G4 has an internal calibration circuit that can be used to calibrate the device. The recommended calibration procedure involves applying a known input voltage and reading the output code, then adjusting the internal calibration registers to achieve the desired accuracy. Texas Instruments provides a calibration procedure in the device's datasheet and application notes.
• What is the effect of temperature on the ADS8321E/2K5G4's performance, and how can I compensate for temperature-related errors?
  The ADS8321E/2K5G4's performance is affected by temperature, with the device's offset and gain errors increasing with temperature. To compensate for temperature-related errors, the device can be calibrated at multiple temperatures, and the calibration data can be stored in external memory. Additionally, temperature sensors can be used to monitor the device's temperature and adjust the calibration data accordingly.