Texas Instruments provides a layout and routing guide in the ADS8284IBRGCT Evaluation Module User's Guide (SLAU445) that should be followed to achieve optimal performance. This includes guidelines for placing decoupling capacitors, routing analog and digital signals, and minimizing noise coupling.
The ADS8284IBRGCT has a built-in calibration feature that can be used to improve accuracy. The calibration process involves writing specific values to the device's registers to adjust the gain and offset of the ADC. The calibration procedure is described in the ADS8284IBRGCT datasheet (SBAS544) and the ADS8284IBRGCT Calibration Guide (SLAA644).
The maximum sampling rate of the ADS8284IBRGCT is 1 MSPS, but this can be limited by the speed of the clock input, the settling time of the analog input signals, and the throughput of the digital interface. The datasheet provides more information on the sampling rate limitations and how to optimize the device's performance.
The ADS8284IBRGCT has built-in error detection and reporting mechanisms, such as overflow and underflow flags, that can be used to detect and handle errors. The device also has a status register that provides information on the current state of the device. The datasheet and the ADS8284IBRGCT Programming Guide (SLAU446) provide more information on how to handle errors and exceptions.
Yes, the ADS8284IBRGCT can be used in a multi-channel or simultaneous sampling application. The device has a built-in sequencer that allows multiple channels to be sampled in a specific order. The datasheet and the ADS8284IBRGCT Sequencer Guide (SLAA645) provide more information on how to configure and use the sequencer for multi-channel applications.
ADS8284IBRGCT datasheet
by Texas Instruments
