Texas Instruments provides a layout guide in the datasheet, but it's essential to follow additional best practices, such as keeping analog and digital traces separate, using a solid ground plane, and placing decoupling capacitors close to the device. A 4-layer PCB with a dedicated analog ground layer is recommended.
The internal reference voltage can be enabled by connecting the REFEN pin to a logic high. However, using an external reference can provide better accuracy and stability. The internal reference is suitable for most applications, but if high accuracy is required, an external reference is recommended. Consult the datasheet for specific configuration details.
The ADS5517IRGZR can achieve a maximum sampling rate of 125 MSPS. However, the actual sampling rate may be limited by the system's clock frequency, analog input bandwidth, and digital output data rate. Additionally, the device's power consumption and thermal performance may be affected at higher sampling rates.
The ADS5517IRGZR provides a 16-bit parallel digital output. The data can be transmitted using various interfaces, such as LVDS, CMOS, or DDR. The device also supports various data formatting options, including offset binary, two's complement, and Gray code. Consult the datasheet for specific details on data formatting and transmission.
The ADS5517IRGZR has a typical power consumption of 1.2 W at 125 MSPS. To optimize power consumption, ensure proper power supply decoupling, use a low-power mode when possible, and consider using a lower clock frequency. For thermal management, ensure good airflow, use a heat sink if necessary, and follow proper PCB design guidelines to minimize thermal resistance.
ADS5517IRGZR datasheet
by Texas Instruments
