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DSASW00297418.pdf
by National Semiconductor
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1 RADECS 2009 Proceedings [DW-1] Low Dose Rate Test Results of National Semiconductor's ELDRS-free Bipolar Comparators LM111 and LM119 Kirby Kruckmeyer, Member, IEEE, Larry McGee, Bill Brow
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3 pins LDR
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LDR SPECIFICATION
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sensitivity of ldr
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