DSAIHSC00039445.pdf by Not Available

Partial File Text High-Reliability High-Speed CMOS Logic ICs CD54HC165/3A CD54HCT165/3A Burn-ln Test-Circuit Connections Static OPEN CD54HC/HCT165 7,9 Dynamic (Use Static II fo r/3 A burn-in and Dy
Datasheet Type Scan
RoHS Unknown
Pb Free Unknown
Lifecycle Unknown

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