Please enter a valid full or partial manufacturer part number with a minimum of 3 letters or numbers

    DSAZSAA0008362.pdf by AVX

    • Conductivity Mechanisms and Breakdown Characteristics of Niobium Oxide Capacitors J. Sikula, J. Hlavka, V. Sedlakova, L. Grmela Czech Noise Research Laboratory, Brno University of Technology Tec
    • Original
    • Unknown
    • Unknown
    • Unknown
    • Find it at Findchips.com

    DSAZSAA0008362.pdf preview

    Price & Stock Powered by Findchips Logo
    Supplyframe Tracking Pixel