DSAE0065866.pdf

Partial File Text TIME DEPENDENT RELIABILITY OF THE PROGRAMMED METAL ELECTRODE ANTIFUSE by Richard J. Wong, Kathryn E. Gordon, and Andrew K. Chan 7-23 7 Reprints Presented at the International Reliability
Datasheet Type Original
RoHS Unknown
Pb Free Unknown
Lifecycle Unknown

DSAE0065866.pdf preview

Download Datasheet

User Tagged Keywords