DSASW0021536.pdf by National Semiconductor

Partial File Text SCANSTA101 Low Voltage IEEE 1149.1 System Test Access (STA) Master General Description Features The SCANSTA101 is designed to function as a test master for an IEEE 1149.1 boundary scan test s
Datasheet Type Original
RoHS No
Pb Free Unknown
Lifecycle Transferred
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SCANSTA101SM SCANSTA101SM/NOPB SCANSTA101SMX/NOPB

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SCANSTA101 SCANSTA101SM SCANSTA101SMX

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